Used BRUKER-AXS S4 Explorer #180372 for sale
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ID: 180372
Wavelength dispersive X-ray fluorescence spectrometer
Standard configuration for liquids, mixed sample
Gas flushing parts package
Detector unit FC and SC
~2006 vintage.
BRUKER S4 EXPLORER spectrometer is a sophisticated tool used to study a wide range of materials and processes. Originally designed for use in high speed atomic force microscopy, S4 EXPLORER is an industry-leading instrument designed to enable users to examine surface topology at nanometer resolution. At its core, BRUKER S4 EXPLORER is a scanning tunneling microscope (STM) system. Utilizing a coaxial drive, it is capable of four-directional scanning. With a maximum scan area of up to 530 nm, it is capable of obtaining granular insight into the structure of a surface down to the atom level. In order to ensure reliable results, S4 EXPLORER incorporates a variety of innovative technologies, such as high resolution imaging and sub-angstrom resolution. Furthermore, a range of accessories, such as microscopy scopes and ancillary components, are available to tailor the system to users needs. BRUKER S4 EXPLORER incorporates state-of-the-art electronics designed to enhance performance. Utilizing a highly sensitive transduction system, the spectrometer can detect even the minutest changes in surface topology. Furthermore, a patented x-y relays design enables the spectrometer to easily jump between different points in the area scanned, allowing for quick and efficient data collection. In addition, S4 EXPLORER is capable of simultaneous detection across the whole scan area, providing an unparalleled level of detail. BRUKER S4 EXPLORER also boasts a wide range of data-handling components. Using powerful software, users can monitor and analyse data to ensure accuracy and precision. Furthermore, the spectrometer can store up to 4GB of data, giving users the ability to easily store and retrieve scans for later review. In summary, S4 EXPLORER is an industry-leading spectrometer capable of examining surface topology with nanometer resolution. Utilizing cutting-edge technologies and features, the instrument allows users to easily and accurately monitor and analyse changes in surface topology down to the atomic level. Furthermore, powerful data-handling capabilities provide users with the tools they need to ensure reliable and repeatable results.
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