Used BRUKER-AXS Vertex 70 #293649663 for sale

Manufacturer
BRUKER-AXS
Model
Vertex 70
ID: 293649663
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BRUKER-AXS Vertex 70 is a spectrometer designed for research in X-ray diffraction (XRD). Vertex 70 is a high performance instrument capable of providing detailed information on the structure, properties, and dynamics of various samples. BRUKER-AXS Vertex 70 is equipped with a high-resolution monochromatic Cu X-ray source, a high-precision sample stage, a detector assembly, and a data acquisition and analysis system. The X-ray source has a wavelength of 0.15418 nm which enables it to detect small, subtle changes in sample parameters. The sample stage can move in three-dimensional space and precisely position a sample relative to the X-ray beam. Combined with this, Vertex 70 has a 1° angular range and can resolve features down to 0.0004°. The detector assembly has a pair of scintillation detectors sensitive to X-ray diffraction peaks which allow for high collection efficiency. BRUKER-AXS Vertex 70 also has an integrated data acquisition system with advanced software for data collection, analysis, and display. The software enables users to customize settings as well as features for specific tasks. It also includes a feature for automated data collection and a library of pre-defined experiments. Vertex 70 also has a user-friendly graphical user interface with a range of different graphical tools for visualizing data. BRUKER-AXS Vertex 70 can be used to analyze a wide variety of materials and parameters including minerals, polymers, crystals, pharmaceuticals, and nanomaterials. As well as being used to analyze samples, the spectrometer can be used to investigate the structure of materials and their properties such as surface roughness, temperature, strain, and crystallinity. It is also used in research areas such as catalysis, corrosion, and thin film preparation. Overall, Vertex 70 is a high performance spectrometer specially designed for detailed research into X-ray diffraction. It has a high-resolution X-ray source and a highly precise sample stage along with an integrated data acquisition and analysis system. Furthermore, the spectrometer is capable of analyzing a wide array of material and parameters with great accuracy.
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