Used BRUKER-AXS Vertex 70 #9233149 for sale

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Manufacturer
BRUKER-AXS
Model
Vertex 70
ID: 9233149
Vintage: 2009
Spectrometer 2009 vintage.
BRUKER-AXS Vertex 70 is a versatile and powerful spectrometer designed for research and industrial applications. It combines fast scanning, high resolution, and operation in even the most demanding environments. Vertex 70 offers users a range of products and services to facilitate the acquisition, analysis, and interpretation of X-ray scattering data from crystalline and non-crystalline samples. The heart of BRUKER-AXS Vertex 70 is its X-ray diffractometer. It is equipped with a high-resolution Osmic-AX Research CCD-XBS detector, which provides peak resolution capability needed for structure analysis. The analyzer is fitted with an open-loop, variable-speed goniometer which further enhances resolution performance. Vertex 70 also includes an automated sample changer with sample tracking capability and a unique power supply with advanced low noise operation. BRUKER-AXS Vertex 70 uses an autoguiding system to ensure automatic and reliable data acquisition. This system is especially useful when analyzing difficult crystalline samples, such as nanosamples. It also offers the widest range of crystallographic operations available in any spectrometer. Vertex 70 uses BRUKER-AXS VertexSense software for data acquisition and analysis. This platform allows for data analysis without the need for users to manually manipulate the raw data. It offers a range of data extraction methods, from single-shot to multi-shot measurements. Other features included in the software are structure analysis, real-time data extraction, material characterization, and text report generation. Overall, BRUKER-AXS Vertex 70 is a powerful spectrometer designed to handle the most difficult sample-measuring tasks reliably. It offers an unsurpassed combination of resolution, speed, automation, and ease of use. With its powerful VertexSense software, data analysis is made easier, allowing for the processing of crystalline and non-crystalline samples.
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