Used CAMECA EX300 #9205994 for sale

CAMECA EX300 is a high-performance secondary ion mass spectrometer (SIMS) designed for the analysis of chemical composition and molecular structures of small particles. This instrument is capable of generating reliable and detailed secondary ion images of samples, allowing for the identification of elemental composition and concentration. EX300 is a high-fidelity system used for the study of a variety of materials ranging from metals to polymer materials. It is equipped with a single ion gun that is capable of selecting a variety of ions with energies ranging from 400-3 000 eV. This ion gun can also be configured to deliver monatomic ions in a range of up to five angles. CAMECA EX300's ion source has an adjustable current range up to 10 nA, allowing for the analysis of particles with small dimensions. The spectrometer's ion optics are designed to ensure that all ions strike the sample surface perpendicularly, minimizing lateral scattering and maximizing the detection efficiency. EX300 uses three main components of analysis: secondary ion imaging, mass spectrometry, and x-ray Fluorescence spectroscopy. These components are used to obtain a more comprehensive view of the sample properties. Secondary ion imaging provides a 3-dimensional representation of the sample structure and composition. This component provides a detailed description of the material's surface by creating secondary ion images which allow for the measurement of particle morphology and physical structure. Mass spectrometry is used to obtain qualitative information about the chemical composition of the sample. This component utilizes the factor of mass to charge in order to accurately identify the types of atoms present in the sample. CAMECA EX300 can also be used to analyze samples through x-ray Fluorescence Spectroscopy (XRF). This component utilizes the emission of x-rays to obtain information about the elemental composition of the sample. In summary, EX300 is a powerful and reliable secondary ion mass spectrometer that can be used to study a variety of materials. Its combination of secondary ion imaging, mass spectrometry, and x-ray fluorescence spectroscopy allows for the comprehensive analysis of sample properties and composition.