Used CAMECA IMS 4F #293769036 for sale

CAMECA IMS 4F is a robust and versatile secondary ion mass spectrometer (SIMS) designed for high-resolution depth profiling and wide range of elemental isotopic analysis. It consists of a high power ion source, sample sputter/etch chamber, mass analyzer and detector. CAMECA IMS4F features two different standard ion sources, a high intensity Cs+ source and a Ga+ or an Au+ secondary ion source. Depending on the application, the appropriate source can be chosen to provide the desired ion yield, mass resolution and sputter rates. The sample sputter/etch chamber is equipped with a diamond or SiC sputter probe and an anode holder. A rotary sample sputter unit allows for variable sample rotation for effective sputtering. The chamber contains a low energy implantation source, enabling depth profiling of samples with very high precision. The mass analyzer of IMS-4F is a double-focusing reflectron time-of-flight instrument that provides high dynamic range and resolution. The mass resolution sensitivity product (MRS), which is a measure of mass resolution, can be set up to 2000. The detector of CAMECA IMS-4 F is either a Faraday cup or a multi-channel plate (MCP) detector. The Faraday cup is a well-suited choice for detecting mid-mass ions, while the MCP detector is better for detecting lower-mass ions. The MCP also improves dynamic range and mass resolution by eliminating any background ions from the detection chain. CAMECA IMS-4F is powered by high-performance software which controls all components for optimal data acquisition and analysis. This readily enables high-speed analysis, spot scans, imaging, and multi-depth profiling. In conclusion, IMS 4F is a highly robust and versatile secondary ion mass spectrometer that provides high resolution and wide range of elemental isotopic analysis for both surface and bulk samples. Its flexibility, combined with its user-friendly features, makes this instrument an ideal choice for a variety of applications.