Used CAMECA IMS 4F #9250201 for sale

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Manufacturer
CAMECA
Model
IMS 4F
ID: 9250201
Secondary Ion Mass Spectrometer (SIMS) Multiple immersion lens strip Duoplasmatron and cesium source Charge auto compensation electron gun for insulator analysis Liquid nitrogen cooled fracture stage attachment Cryo pump vacuum system Dynamic transfer system Scanning ion image display Secondary imaging.
CAMECA IMS 4F spectrometer is a multi-collector mass spectrometer designed for high-spatial-resolution imaging and depth profiling of thin-film materials. It allows for accurate isotopic characterisation of materials and can be used to construct high-resolution 3Dmaps of deposits and particle distribution on the surface and in the subsurface of a sample. CAMECA IMS4F equipment is a four-element collector mass spectrometer. Each collector contains four filaments, allowing for full isotopic characterisation of the sample. The anode of each collector is in the form of a curved slit and is connected to a double differential controller, allowing for spatial and temporal control of the ion beam. The collectors are positioned orthogonally and can be moved to different positions relative to the sample surface. IMS-4F system is capable of both external and internal ion imaging. External ion imaging (EII) is used for imaging a sample's surface, allowing for isotopic mapping of deposits such as impurities or contaminants. Internal ion imaging (III) is used for imaging the subsurface of a sample, allowing for high-resolution depth profiling of deposition or ion implantation. CAMECA IMS-4 F unit is equipped with several features that help ensure accurate data collection. These include a Bruker ICA optics that allows for high ion current density, a Merlin pre-amplifier for high signal-to-noise ratio, and a semi-intelligent electronics machine that allows for a wide range of filtering and focusing options. IMS4F tool is capable of ultra-high-precision spatial resolution. It is capable of imaging particles as small as 0.3 nanometers in size. This ability makes IMS 4F asset ideal for imaging nano-scale structures within thin-film materials. In summary, CAMECA IMS-4F spectrometer is a powerful tool for high-spatial-resolution imaging and depth profiling of thin-film materials. Its four-element collector and advanced optics enable accurate isotopic characterisation of samples for a variety of applications. With its ability to image particles as small as 0.3 nanometers in size, it is a highly versatile and accurate mass spectrometer.
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