Used CAMECA SX-100 #293773834 for sale

Manufacturer
CAMECA
Model
SX-100
ID: 293773834
Electron microprobe Beam current range: 5x10-7 to 10-12 A Beam position: ± 0.5 µm in 1 hour at 10 kV Beam current variation: ± 0.5 % in one hour ± 1 % in 12 hours Accelerating voltage: 0.2 to 30 kV Secondary Electron Detection and Imaging (SEM) Energy Dispersive Spectrometry (EDS) Backscattered electron detector Wavelength dispersive X-rays spectrometer Light optics Vacuum system CL Detector Plasma cleaner.
CAMECA SX-100 is an advanced spectrometer designed for high-resolution surface characterization and elemental analysis. It is manufactured by CAMECA, a leading provider of analytical instruments for research and industrial applications. CAMECA SX 100 incorporates state-of-the-art technologies to deliver superior performance and accuracy in analyzing the elemental composition and structure of materials at the micro- and nano-scale levels. At the heart of SX-100 is a high-performance electron probe microanalyzer (EPMA) system that utilizes a focused electron beam to excite the sample surface and generate characteristic X-rays. These X-rays are then detected and analyzed to determine the elemental composition of the sample. SX 100 is equipped with multiple detectors, including wavelength dispersive spectrometers (WDS) and energy dispersive spectrometers (EDS), to enable precise and simultaneous analysis of a wide range of elements. One of the key features of CAMECA SX-100 is its exceptional spatial resolution, which allows users to study samples with sub-micron accuracy. The instrument is equipped with a high-precision stage that can position the sample with nanometer-level precision, enabling detailed mapping and imaging of elemental distributions across the sample surface. This capability is particularly valuable in research fields such as materials science, geology, and semiconductor analysis, where characterizing microstructures and trace elements is crucial. CAMECA SX 100 offers a wide range of analytical modes and functionalities to meet diverse research needs. It supports automated mapping and line scanning capabilities for fast and efficient data collection, as well as advanced quantitative analysis tools for accurate elemental quantification. The instrument also features sophisticated data processing and visualization software that enables users to interpret and present their results in a clear and informative manner. In addition to its analytical prowess, SX-100 is designed for ease of use and reliability. The instrument is equipped with intuitive user interfaces and software controls that streamline the experimental workflow and minimize operator error. Its robust construction and high-quality components ensure stable and reproducible performance over extended periods of operation, making it an ideal tool for both research laboratories and industrial quality control settings. Overall, SX 100 represents a cutting-edge solution for high-resolution surface analysis and elemental characterization. With its advanced capabilities, superior performance, and user-friendly design, CAMECA SX-100 is a versatile and powerful tool for a wide range of analytical applications. Whether studying geological samples, investigating semiconductor materials, or performing quality control inspections, researchers and industry professionals can rely on CAMECA SX 100 to deliver accurate and insightful results that drive scientific discovery and technological innovation.
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