Used CAMECA SX-50 Marco EPMA #62374 for sale

ID: 62374
Wafer Size: 6"-8"
Electron microprobe, 6"-8" JVC Video camera Turbo pump with loadlock Ion getter pumps at the gun: Thermally assisted field emission system EDAX: Energy dispersive X-ray detector EDX Liquid nitrogen for cooling BSE Erectors Loadlock (3) WDX Spectrometers Crystals: LiF, PET, TAP, ODPb, PC1, PC2, PC3 6" Stage, HV, Pump control run digital from PC (2) Roughing pumps: Column Loadlock BLAZERS TPU510 Turbo for high vacuum LEYBOLD Trivac D16B Vacuum pump ALCATEL 2012 A Vacuum pump (2) Integrated turbo pumps Analytical detectors: Si: Li Energy dispersive X-ray for rough analysis (3) High resolution wavelength dispersive X-ray spectrometers (WDX) With flow counters Crystals: LiF PET TAP ODPb PC1 PC2 PC3 Manuals Computer Spare parts Power supply: 230 VAC, 50 Hz, Single phase, 22 Amps.
CAMECA SX-50 Marco EPMA is a powerful energy dispersive X-ray spectrometer that delivers superior performance in a variety of applications. It is uniquely designed to enable the determination of sub-micron regions, offering unsurpassed resolution and fluorescent background suppression. The SX-50 Marco provides excellent semi quantitative elemental analysis of both electron-forward, and light element element, with the highest resolution of any commercially available spectrometer, greatly reducing both on-axis and off-axis contaminants and noise. The SX-50 Marco energy dispersive spectrometer is equipped with a medium resolutio thetamax detector, capable of detecting a wide range of X-ray energies from the Lyman-alpha line of H to the M-shell lines of Re, with capability of elemental mapping from Be to U. The equipment comes with software for acquisition, analysis, interpretation and presentation of data. The system also supports the combination of multiple layers of information, allowing for the more efficient merging and comparison of overlapping spectra. The SX-50 Marco is capable of providing superior performance in a variety of applications such as analysis of nanostructured materials, mineral characterization, thin film and coating analysis, and the characterization of polymers, composites and ceramics. The unit features a fully integrated, multicollection feature which is capable of capturing X-ray signals in both channels (i.e. backscatter and transmission) simultaneously. In addition, the spectrometer offers high sensitivity, elemental mapping and imaging, both in real-time and batch mode. SX-50 Marco EPMA features the latest in imaging technology, with the ability to collect data in both the X-ray energy and the X-ray intensity maps simultaneously, offering superior flexibility in mapping complex materials. Additionally, the spectrometer supports both a semi-analytical and a quantitative analysis, with the ability to determine both major and trace element concentrations, as well as other properties such as thickness, composition, composition/density and crystalline structure. CAMECA SX-50 Marco EPMA also comes with several other advanced capabilities, such as full transmission and monochromatic modes, which are used to maximize sensitivity in a range of spectra capture situations. The machine also offers an easy to use, user friendly graphical user interface, designed to make navigating the software simple and intuitive. Furthermore, the tool will operate either in stand-alone mode or be integrated with an SEM for enhanced performance. Overall, SX-50 Marco EPMA offers superior elemental analysis performance, with unmatched ability to resolve complex nanostructured materials, offering unparalleled performance.
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