Used CAMECA TOF-IMS 4F #9351327 for sale

CAMECA TOF-IMS 4F is a high-performance secondary ion mass spectrometer (SIMS) developed by CAMECA for studying surfaces and interfaces. Its design is based on time-of-flight (TOF) mass spectrometry technology and a four-field ion optical equipment. The instrument utilizes a secondary ion source to generate focused ion beams that are directed towards the sample surface. The ions interact with the sample as they interact in the depth profile of the sample, allowing for the depth profiling and characterization of surfaces and interfaces. The secondary ions are separated according to their mass-to-charge ratio and detected using an MCP detector. The TOF characteristic of the system allows for fast acquisition of mass spectra and comprehensive elemental identification. TOF-IMS 4F unit has an improved spatial resolution, enabling more accurate depth profiling and imaging. The ion optics are composed of a plasma source cathode, a differential extraction machine, an ion mirror, and a secondary electron suppressor. The ion optics tool allows for rapid acquisition of high resolution secondary ion mass spectra from the sample surface. The gas-coupled low-energy electron detector (GC-LEED) can also be used for imaging the sample surface. CAMECA TOF-IMS 4F also offers a wide range of applications, such as surface analysis, materials characterization, depth profiling of atomic layering, imaging of surface structures, and sample characterization. The asset can also be used for elemental identification and surface analysis applications, including semiconductor characterization, surface and interface analysis, contamination characterization, and failure analysis. TOF-IMS 4F is a powerful and versatile tool for materials research, offering high sensitivity and speed, low power consumption, and excellent sample characterization capabilities. Additionally, the model can be upgraded with additional accessories for additional capabilities.