Used CAMECA TOF-SIMS IV #293587143 for sale

CAMECA TOF-SIMS IV is an advanced spectrometer designed to allow researchers to measure the interactions between sample atoms and electrons, providing information useful for a variety of analytical tasks. As the name implies, it operates with the time-of-flight secondary ion mass spectrometry (TOF-SIMS) technique, which enables the measurement of transient and trace elements present in a sample surface in the ionic form. This instrument incorporates a choice of high energy density analysis sources, with its static high-energy ion acoustic lens system. This allows for rapid and accurate calibration of the TOF detector to suit the analytical needs of each experiment. This setup provides an optimal combination of ion counts and mass accuracy, enabling researchers to acquire mass spectra with a wide dynamic range, in a variety of time frames. This is achieved through the instrument's three-anode design, which impartially selects sample ions and sends them to a time-of-flight detector mounted above the sample area. TOF-SIMS IV is also designed to reduce environmental contaminations, both those inherent to the instrument and those coming from the ambient environment, through its sample compartment which is thermally and vacuum-sealed. This keeps the sample from becoming homogeneous with the air or exposed to mutual interactions with elements in the environment. The instrument can also be equipped with a surface probe for imaging and sample mapping, allowing for a convenient way to gather information about the sample's composition and morphology. CAMECA TOF-SIMS IV is able to map up to a resolution of 1 micron, providing the user with an accurate and detailed look into the sample's physical characteristics. The instrument is highly modular and can be easily adapted to the requirements of an experiment, giving the user a complete control over TOF-SIMS IV. The software interface associated with the instrument provides a convenient and easy-to-use interface to control the mass spectrometer and to view and analyze the acquired spectra. This helps researchers quickly identify isotopic and elemental composition of materials and to detect impurities or chemical composition changes. CAMECA TOF-SIMS IV has become a preferred tool among researchers due to its robustness and its ability to provide accurate results. It is widely used in fields such as surface engineering, material science, life sciences, microelectronics and semiconductor industry, and catalysis, to name a few. All of these advantages make TOF-SIMS IV an exceptional way to accurately and quickly analyze and gather information about complex surfaces.