Used ION TOF TOF SIMS IV #9243595 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

Manufacturer
ION TOF
Model
TOF SIMS IV
ID: 9243595
Vintage: 1999
Secondary Ion Mass Spectrometer (SIMS) Bi Cluster ion gun Ga Liquid Metal Ion (LMI) gun Cs Ion gun Gun for gases INFICON Quadrex 200 Residual gas analyzer Imaging camera Microscope 1999 vintage.
An ION TOF TOF SIMS IV (Secondary Ion Mass Spectrometer) is an advanced form of mass spectrometry that combines several different technologies for extremely accurate and precise molecular characterization. This instrument enables highly accurate and sensitive measurements of the mass-to-charge (m/z) values of ions, along with their isotopic compositions. The TOF ION TOF TOF-SIMS IV utilizes an ion source to ionize a sample, either by bombarding it with electrons, laser light, or gas-phase chemical reactions. These ions travel through an electrical field and are then accelerated into a time-of-flight (TOF) chamber. The ions are then separated according to their masses and directed towards the detector. The TOF TOF SIMS IV spectrometer is equipped with a time-of-flight (TOF) analyzer that measures the time-of-flight of each ion, thereby allowing the user to determine the mass-to-charge ratio of the ion. This analyzer also enables the determination of the isotopic composition and elemental composition of the sample. Additionally, the instrument is equipped with an ion detector to provide information about the number of ions in the sample. TOF-SIMS IV is an advanced tool for surface analysis and is capable of measuring the ion composition of surfaces with high resolution. It can detect and analyze very small particles of matter, even down to the atomic level. In addition to its surface analysis capabilities, it is also used for inorganic and organic analysis, as well as for applications in drug discovery and medical diagnostics. ION TOF TOF SIMS IV can analyze particles from a variety of different sample sizes, including from nanograms to milligrams. It is also capable of measuring the isotopic ratios with up to 10 decimal points of accuracy, making it an invaluable tool for researchers studying isotope geochemistry. Overall, ION TOF TOF-SIMS IV is a versatile and robust mass spectrometer with a wide range of applications in many different fields. Its ability to make precise and accurate measurements is invaluable for scientists studying a variety of materials, from particles on the nanoscale to acids and solids on the macroscale. It also provides a powerful tool for researchers in drug discovery and medical diagnostics, enabling them to better understand the composition of various compounds.
There are no reviews yet