Used JEOL JSX 3400R #189263 for sale

JEOL JSX 3400R is a scanning electron microscope (SEM) spectrometer that incorporates the latest advances in technology to deliver an accurate, high-speed data collection capability. This equipment offers a wide range of analytical functions, including energy dispersive X-ray fluorescence (EDX) and transmission electron microscopy (TEM). To measure small particles with an electron beam, JSX 3400R features an advanced scanning mechanism. This mechanism ensures high resolution with a beam energy resolution of 0.025eV. The AE lens, coupled with the automated beam current stabilization, compensates for any sample drift during scans. Additionally, environmental control technology allows the JSX 3400 to work in controlled temperature and humidity environment, resulting in improved measurement accuracy. This system also provides a variety of image processing functions, amplifying and quantifying results with advanced algorithms. Through the data archiving feature, users can store images and process analysis in their computers. Additionally, the built-in OIServer enables speedy data transfer from the JSX to anywhere in the world. JEOL JSX 3400R also offers a range of features for improved measurement accuracy and efficiency. These features include a high-power optical microscope with a 6-axis manipulator, a peripheral iD stage controller, a built-in EDS-SLD Unit, and a two-dimensional optical profilometer. JSX 3400R is a reliable and versatile tool for spectrometric studies. Its advanced features enable precise measurement of small particles with the highest accuracy. The machine's advanced image processing capabilities also allow users to refine and quantify their analysis. With its powerful combination of design and features, JEOL JSX 3400R offers researchers an invaluable tool for understanding materials on the nanoscale.