Used OXFORD X-Max #9375044 for sale
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ID: 9375044
Energy Dispersive Spectrometer (EDS)
51-XMX0020 Detector
HITACHI SU-3500 Scanning Electron Microscope (SEM)
Operating system: Windows 7 Pro
Calibration performance:
Discriminator calibration (FxMxS): 56x36x61
Peak position calibration: 1851
Quant optimization: Cu
Specified resolution: 127 eV
Extrapolated system resolution: 124 eV (Triggered noise strobe)
Measured detector resolution at Mn K Alpha: ≤127 eV
Nickel L-K: >0.85 at 35° TOA and 20 kV
Measured detector resolution at C K Alpha: ≤56 eV
Measured detector resolution at F K Alpha: ≤64 eV
Detector temperature: -60°C
Peltier power: 5.387 W.
OXFORD X-Max spectrometer is an advanced spectrometer designed for high-resolution wavelength-dispersive X-ray fluorescence (XRF) applications. It features a newly developed detector array that provides improved resolution, efficiency and flexibility. It operates with up to four X-ray excitation sources that can be individually selected for optimized element detection. The detector array consists of up to six elements, and each of them is arranged with different angles and angles of incidence. This arrangement allows for a wide range of X-ray wavelengths to be captured simultaneously, enabling high-resolution information to be obtained with maximum efficiency. The array is constructed with stacked-argon filled detector cells, designed to maximize X-ray detection efficiency and to minimize fluctuations in counts. X-Max is also equipped with a new Si(Li) detector which provides high-detection efficiency for the light elements. OXFORD X-Max features an increased dynamic range that ranges up to 10 thousand counts, allowing for high sample throughput and improved signal-to-noise ratio. The spectrometer is also designed with a wide range of interference suppression techniques, including beam shaping, monochromator subtraction, and pulsed operation for noise suppression and optimal resolution. X-Max utilizes a unique vacuum chamber and custom cooling technology to ensure long-term reliability and performance. Its custom-designed refractive optics provide an improved thermal environment and minimized drift to ensure accurate readings. OXFORD X-Max also features built-in automatic exposure control, allowing users to optimize their samples' conditions to maximize resolution and minimize the risk of overexposure. X-Max features advanced software designed to streamline data integration and analysis. Its intuitive graphical user interface (GUI) allows users to monitor their measurements, view raw data and access results instantly. The software also features an integrated search engine with customizable sorting options, enabling users to quickly locate desired elements. Overall, OXFORD X-Max provides a powerful stand-alone spectrometer that combines impressive user-friendly software with a robust detector array for improved resolution and efficiency. Its user-friendly design, high resolution capabilities, and advanced software make X-Max an ideal choice for XRF spectrometry.
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