Used PERKIN ELMER Optima 2100 DV #9378150 for sale

PERKIN ELMER Optima 2100 DV is a state-of-the-art double-beam ultraviolet (UV)-visible (VIS) spectrometer is designed for the most demanding applications in research and development. This advanced double-beam UV-VIS spectrometer features a wide spectral range (190-1100 nm) and superior performance for excellent results. Optima 2100 DV offers full spectral coverage with an intuitive software package for easy operation and reliable data collection. PERKIN ELMER Optima 2100 DV offers precise measurements at scans speeds up to 15,000nm/min, and its thermoelectric cooled dual detectors help minimize noise and maximize peak sensitivity. It also features advanced automated features for accurate quantitative measurements, such as fractional optimization, spectrum averaging, and multiple-point spectral calibration. The sample compartment houses the detector and light source, as well as a fiber optic coupled sample holder. Optima 2100 DV's intuitive software interface makes commanding the spectrometer simple and efficient. This package enables users to adjust parameters such as scan speed, scan range, wavelength range, integration time, and more. It also offers advanced features, such as spectral interpolation, spectral subtraction, and spectral fitting. PERKIN ELMER Optima 2100 DV also offers superior spectral resolution with a 0.3 nm/nm bandwidth, which allows researchers to capture a wider range of information. This spectrometer's modular design allows for easy connectedness to many third-party injection systems, thus making it a versatile instrument for various applications. Optima 2100 DV provides users with the power and precision they need for their research. Its precision construction, wide spectral range, modulation rate and dynamic light source enables researchers to easily monitor samples, track processes, and accomplish many tasks faster and more accurately than ever before. Furthermore, PERKIN ELMER Optima 2100 DV's advanced automation capabilities are designed to reduce operator time and maximize accuracy in research and development.