Used PERKIN ELMER Optima 5300DV #293636564 for sale

PERKIN ELMER Optima 5300DV Spectrometer is an advanced, high performance double-beam spectrometer designed to provide accurate, real-time measurements of atomic and molecular spectra. It is capable of analyzing and quantifying a wide range of samples including liquids, solids, and gases across a variety of ranges from the ultraviolet (UV) to the near-infrared (NIR). PERKIN ELMER OPTIMA 5300 DV features an integrated UltraScanTM data acquisition equipment that allows for high speed, simultaneous scanning of both beams, giving faster and more accurate analysis than traditional single-beam instruments. The 5300DV features a powerful optical system which is well suited for measuring the full range of sample types and concentrations. A permanently aligned long-life dual Xenon lamp provides exciting broadband light for optimal excitation of both atomic and molecular samples. The light is collected and filtered by a set of dichroic mirrors and then focused onto the sample holder with an advanced optical unit. The spectrometer uses grating technology ranging from 1200 to 600 lines/mm, providing a wide range of spectral resolution options. The spectrometer also contains several integrated components that enable users to accurately analyze their samples. These include an automatic wavelength calibration machine, a variable aperture size to optimize signal to noise ratio, and a real-time spectral acquisition tool. A built-in asset controller provides an intuitive user interface with an easy-to-use graphical display, allowing users to access a variety of settings and tools without the need for additional software. Optima 5300DV Spectrometer is an ideal tool for research, scientific, or industrial applications. Its superior signal-to-noise ratio and advanced features make it an ideal choice for a wide range of applications, from spectrophotometry to chromatography. With its advanced dual-beam architecture and fast scanning speeds, OPTIMA 5300 DV can be used to quickly and accurately measure samples of varying complexity.