Used PHYSICAL ELECTRONICS / PHI TRIFT I #293813983 for sale

PHYSICAL ELECTRONICS / PHI TRIFT I
ID: 293813983
Time of Flight Secondary Ion Mass Spectrometer (ToF-SIMS).
PHYSICAL ELECTRONICS / PHI TRIFT I is a powerful, fully automated spectrometer designed for low-angle time-of-flight mass spectrometry (TOF-MS). The equipment utilizes a linear ion trap, or RF-only ion source, to achieve a robust and highly sensitive environment for accurate and fast measurement. The system also gathers data with a patented digital TOF detection unit. PHI TRIFT I features an advanced robotic auto-sampler for ease of use. The dynamic range of the machine is significantly increased with a range of 3 to more than 6000 m/z with mass resolutions of 5 to 6000 m/z. It has a peak capacity of 18,000 ions for statistical data analysis of complex mixtures. The tool has user friendly software for operation, and the integrated data analysis suite contains unique features such as interactive visualisation tools for graphical representations of the sample. The unique design of PHYSICAL ELECTRONICS TRIFT I incorporates both Chemical Ionization (CID) and Electron Impact (EI) technologies, allowing for the study of both mono-isotopic and multiline spectra. This combination of techniques provides the highest application accuracy on a variety of surfaces, such as metals and polymers. TRIFT I allows for a variety of detection techniques. Single Ion Counting (SIC) and Active Pixel Controller (APC) up to 10,000 frames/second can be used for high throughput organic compound analysis, allowing for statistically robust data analysis. The optional fragment-ion scanning capabilities give the user precise detailed information on the compositional differences between organic compounds. The data extraction tools are designed to give intuitive views into the characteristics of a sample. PHYSICAL ELECTRONICS / PHI TRIFT I also features intelligent temperature control for the ion optical elements and an automated injector/detectors for direct analysis of liquid and solid samples. It also includes an optional ultra high vacuum chamber for easy optimization of the quantitative and qualitative analysis. It has a fully customized user interface with many different functions, making it a more efficient and intuitive way for users to design their experiments. PHI TRIFT I is an extremely powerful, versatile, and high-performance spectrometer for a broad range of applications. It is designed for reliable operation and maximum adaptability in combination with various sample matrices and automated sample handling possibilities. The instrument is capable of quickly and accurately carrying out routine measurements, enabling researchers to acquire high-quality data in the shortest time possible.
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