Used PHYSICAL ELECTRONICS / PHI TRIFT III #9106480 for sale

PHYSICAL ELECTRONICS / PHI TRIFT III is a versatile and powerful spectrometer designed for PHI (PE) measurement applications. It features a versatile six-channel detection equipment capable of measuring and analyzing physical and electrical properties at the nano, picosecond, and femtosecond levels. PHI TRIFT III is the third in a series of spectrometer instrumentation developed by PHYSICAL ELECTRONICS. PHYSICAL ELECTRONICS TRIFT III offers a wide range of information and analysis tools that enable comprehensive testing and analysis of semiconductor materials and devices,including voltage-sensitive resistors, optoelectronic devices, power semiconductor devices, and integrated circuits. PHYSICAL ELECTRONICS / PHI TRIFT 3 is also great for probing a variety of fields, including electrical, optical, and thermal properties. PHI TRIFT 3 is equipped with a high-resolution Faraday-effect detection system, which provides ultra-fast, picosecond-level, shot-noise-free measurements. It is also equipped with a broad-band pulse laser for measuring junction capacitance, diffusion capacitance, and related properties. The laser has a diode, flash lamp, and photodiode for optically probing any device under test. PHYSICAL ELECTRONICS TRIFT 3 is also equipped with a microwave frequency noise testing unit for providing fast and accurate noise measurements. The machine offers the capability to study tool acoustics, environmental noise sources, and thermal noise. Additionally, PHYSICAL ELECTRONICS / PHI TRIFT 3 is able to measure the gigahertz noise of nanoscale devices. PHI TRIFT 3 has an integrated E-field-sensor unit that enables picosecond-level electrical measurements, including electric fields, inductive components, capacitive elements, and other characteristics. This asset can measure the physical properties of transistors, bipolar junction transistors, and field-effect transistors. PHYSICAL ELECTRONICS TRIFT 3 is also equipped with advanced field emission-field measurement systems, used to study nano-scale electrophysiological responses. The model can measure dielectric response, electron field response, and their interaction. Its scanning electron microscope allows microfeatures of nanodevices to be studied on a nanometer-scale resolution. In conclusion, PHYSICAL ELECTRONICS / PHI TRIFT 3 spectrometer is an ideal instrument for physical, electrical, and optical testing applications. It contains a comprehensive set of measuring and analysis tools for investigating semiconductor devices at the picosecond and femtosecond level. Its highly efficient E-field-sensor and advanced field-emission-field measurement systems make it an invaluable tool for nano-scale device characterizations.