Used SCIENTIFIC ANALYSIS INSTRUMENTS / SAI MiniSIMS ToF #9062424 for sale
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ID: 9062424
System
Mass Spectrometer: Time of Flight (ToF), compact reflectron geometry, secondary ion pulsing
Primary Beam: Ga+, current ~3 nA, energy ~5 to 7 keV
Expected Emitter lifetime > 200 emission μA hours
Pumping System: Turbomolecular + diaphragm pumps
Computer Hardware: Dedicated PC with (2) monitors
Positive and negative secondary ion detection
Secondary electron and secondary ion imaging
Defocused primary beam for static SIMS analysis
Dynamic SIMS capability
Charge neutralization for insulating samples
Integrated data processing software
Data System Windows XP or 7 compatible
Instrument control, spectrum and image acquisition and display
Additional Options:
(1) Spectral library with search facility
(2) Enhanced Sample Handling
10 cm (4”) samples or multiple samples with automated analysis
General:
Size: True benchtop, < 0.80 m2 footprint + PC
Supplies: Single phase mains electrical supply
Power Requirements: 1.2kVA without PC, approximately 2.3kVA with PC
Ambient Temperature: Between 15°C and 25°C
Sample Handling:
Sample Type: Vacuum-compatible solid, < 0.5 mm surface roughness
Sample Size: < 12.5 mm diameter x < 6.5 mm thickness for conducting samples and
< 9.5 mm diameter x < 5 mm thickness for insulating samples
Sample Loading Time:~5 minutes for standard sample stage
Optional Upgrade available: < 100 mm diameter and < 12 mm thickness or up to 31 standard samples
Loading time ~35 minutes
Performance:
Base Pressure: < 1 x 10-6 mbar
Mass Range: m/z = 1 to 1200 daltons
Mass Resolution: m/dm > 650 @ m/z = 27 daltons (FWHM)
Mass Accuracy: Better than 0.2% above m/z = 12 with internal spectrum calibration
100
Sensitivity I > 1 x 104 cps/nA, I = Σ (I(xMo+) + I( xMoO+))
Analysis Area:
Defocused beam:-
Fixed 2.7 +/- 0.3 mm diameter area
Focused beam:-
Minimum limited by primary beam (see spot size)
Maximum 4.5 mm x 4.5 mm image area for conducting samples
1.5 mm x 1.5 mm image area for insulating samples
Primary Beam Spot Size: < 10μm @ 3 nA / 6 keV Ga+ for conducting samples
< 50μm @ 3 nA / 6 keV Ga+ for insulating samples.
SCIENTIFIC ANALYSIS INSTRUMENTS / SAI MiniSIMS ToF is a high-performance spectrometer designed to measure and analyze the composition of both solid and organic samples. This instrument is ideal for applications such as nano-scale analysis, drug discovery, material identification, and chemical imaging. SAI MiniSIMS ToF has a unique cylindrical geometry enabling sample-wide imaging and analytical capabilities. It consists of a selection of lenses which focus the ionized sample beam onto an orbiting detector. This detector then records the incoming particles as a function of time. By analyzing the detected molecules as a function of time, SCIENTIFIC ANALYSIS INSTRUMENTS MiniSIMS ToF is able to obtain an accurate and detailed chemical analysis of the sample. The ionization process for MiniSIMS ToF is achieved through the use of an ion gun. This gun is an external source of charged particles that can be operated either in the positive or negative polarity mode. The ion gun is used to select the particles which will create the ions and also to control the energies at which they are generated. With this ion gun, it is possible to measure ultra-fine levels of isotopic composition. SCIENTIFIC ANALYSIS INSTRUMENTS / SAI MiniSIMS ToF has two different methods of operation: primary and secondary. In the primary mode, particles are bombarded with a beam of electrons and the resulting ions are then measured for their time of flight (ToF). This is used for obtaining the high-resolution molecular images and exact mass/charge measurements. In secondary mode, unstable isotopes are detected with a slow-secondary ion mass spectrometer to measure isotopic differences between the ions. Overall, SAI MiniSIMS ToF high-resolution spectrometer offers a powerful and reliable instrument for analysis and imaging applications. Its high-resolution particle detectors provide ideal performance for various analysis techniques. In addition, its ion gun allows for the generation of ions with different energies and multiple polarity modes. This enables both identification and quantitation of various molecules in the sample. With its versatility, speed, and accuracy, this instrument is an ideal choice for any laboratory.
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