Used SHIMADZU EPMA-1720 #293586145 for sale

SHIMADZU EPMA-1720
Manufacturer
SHIMADZU
Model
EPMA-1720
ID: 293586145
Spectrometer Observation optical system: Resolution: 1 μm Field of view: Approx. 600 μm dia Subject depth: 4 μm Sample stage system: Maximum stage drive range: X, Y: 90 mm, Z: 7 mm Minimum feed distance: X, Y: 0.02 μm, Z: 0.1 μm Maximum stage drive speed: X, Y: 15 mm/sec Z: 1 mm/sec Analyze elements range: 4Be to 92U Number of X-ray spectrometers: 2 to 5 Channels X-ray take-off angle: 52.5° Rowland circle radius: 4" Evacuation system: Vacuum level analysis chamber: 1.0 x 10^−3 or less Evacuation pump: Turbo molecular pump, Oil rotary pump Preliminary evacuation: Oil rotary pump Vacuum detection: Penning gauge, Pirani gauge Automated Functions: Automatic evacuation, Automatic baking Electron optical system: Electron source: W filament Secondary-electron image resolution: 6 nm Accelerating voltage: 0.1 to 30 kV Beam current: 1 pA to 1 μA Magnification: 40× to 400,000× Back-scattered electron detector: 4-Block, Semiconductor detector Objective aperture: Fixed type Operating system: Windows 10 Pro.
SHIMADZU EPMA-1720 spectrometer is an energy dispersive X-ray (EDX) spectrometer designed for elemental analysis. It is chiefly used for the analysis and quantitation of elemental concentrations in the range of parts per million (ppm) to weight percent. It is a lab-compatible model equipped with a robust high-vacuum sample chamber and an advanced control system. EPMA-1720 consists of a rotary anode X-ray tube, ion-optical column, micro-channel plate detector, sample changing device and a windows-based host computer (HPC). The rotary anode X-ray tube produces X-rays according to the voltage and current set using the attached HPC. The HPC also serves as an interface, linking the spectrometer to other external components like a deuterium lamp. The ion-optical column is made up of a pair of collimators and slits, a scanning deflector, and a sample defining aperture. The collimator and slit assembly limits the X-ray distribution entering the ion-optical column. The scanning deflector scans the X-rays over the sample defining aperture at 25 kV to determine the energy range. The micro-channel plate detector consists of an MCP assembly, signal amplifier, anamorphic prism and a phosphor screen. The signal amplifier features signal-dependent gain adjustment and a low-noise amplifier with noise levels as low as 0.7e- rms. The anamorphic prism separates the component energies while the phosphor screen converts the imprint of the exciting X-ray beam into a visible light image. SHIMADZU EPMA-1720 is also equipped with a sample changing device that allows the system to switch quickly between sample positioning levels. This device also acts as a shield against X-ray contamination. Meanwhile, its windows-based HPC monitors and stores the spectrometry data. Overall, EPMA-1720 is an advanced EDX spectrometer designed for fast, accurate and reliable elemental analysis on solid and liquid samples. Its rotary anode X-ray tube and micro-channel plate detector allow the system to identify elements in the range of ppm to weight percent. And its sample changing device ensures contamination free conditions.
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