Used PERKIN ELMER Lambda 45 #9402194 for sale
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PERKIN ELMER Lambda 45 is a double beam spectrophotometer designed to provide accurate, precise and sensitive measurements of diffuse reflectance, absorbance, % transmittance and ratios. It is capable of wavelength scanning between 190 and 1100nm, integrating sphere diffuse reflectance measurements, multipoint kinetics, an autosampler and multiple detector configurations. Lambda 45 features a long-life Xenon lamp which ensures greater data accuracy and stability over time. The instrument's rugged metal housing and easy-to-use programs enable reliable measurements over prolonged periods of time, with minimal maintenance requirements. Its sophisticated optics and high-performance glass filters enable the analysis of weak absorption spectra and determination of the element concentrations. This spectrophotometer is manufactured using premium grade components for durability and accuracy, and is compliant with international quality standards. It has a wide dynamic range and a large sample compartment that can accommodate up to ten samples at a time. The instrument includes a fast and accurate Peltier cooled CCD (Charge-Coupled Device) detector that enables the measurement of both single and multiple wavelength scans. The spectrophotometer's user-friendly interface allows for easy operation and data interpretation. Importantly, PERKIN ELMER Lambda 45 comes with two modes of operation - Manual Mode and Autosampling Mode. The Manual Mode is ideal for fast and single-point sampling, while the Autosampling Mode is refitted with an automated weighing system and sample tray, allowing up to 10 samples to be run at one time. These features make this spectrophotometer an excellent choice for routine, multi-sample analysis. Overall, Lambda 45 is an ideal choice for research and laboratory applications that demand efficient, accurate and precise spectrophotometric measurements. It is an excellent choice for experiments that require a wide range of wavelength scanning, multiple detector configurations, and integration sphere diffuse reflectance measurements, to accurately and consistently measure the samples. This powerful instrument simplifies routine analysis and is sure to provide reliable and repeatable results.
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