Used KLA / TENCOR SP1-TBI #9351867 for sale

KLA / TENCOR SP1-TBI is a mask and wafer inspection equipment designed for front-end production lines. The system offers a fully automated, non-contact two-dimensional and three-dimensional inspection process to ensure the quality of semiconductor components. The unit combines advanced image processing, robotics, and material handling capabilities in a single modular package. KLA SP1T-BI uses advanced line-scan imaging technology and data correction algorithms to produce crisp, high-resolution images. This high-resolution data is fed into an automated defect-detection machine which utilizes advanced image processing algorithms to detect surface defects and topography variations. The tool also has the flexibility to inspect a wide variety of sample types and sample shapes. TENCOR SP1 TBI is capable of performing bin inspection of 2x4, 2x6, 3x3 and 4x4 mm components. The asset also has the capability to detect a variety of types of non-scale defects such as photoresist residue, scratches, pits and voids. The model can also measure the Edge Profile of the wafer for defect characterization. TENCOR SP 1 TBI also uses robotics for automated handling and positioning of the mask and workpiece. This helps to ensure precise alignment of the equipment components at all times. The system can also be configured to accommodate a variety of different sample sizes and shapes. KLA / TENCOR SP1 TBI is designed with a user-friendly graphical interface and provides a variety of statistical control functions to monitor the quality of the samples being inspected. The unit is also capable of storing large amounts of data, enabling the user to run detailed statistical analysis of defects and process data. In addition, TENCOR SP 1-TBI offers a variety of features for data output, including standard image formats, ASCII data, netlist output, and database files. As a result, the machine can be easily integrated into a host of other software and hardware environments. TENCOR SP1T-BI is a powerful and reliable mask & wafer inspection tool that is designed for high performance and accuracy. Its advanced imaging and automation capabilities allow it to accurately inspect samples, and its flexible configuration enables it to meet a variety of application requirements. With its user-friendly interface, extensive analysis functions, and data output capabilities, SP 1-TBI is an ideal solution for semiconductor component production lines.