Used VEECO / DEKTAK AP 150 #9228646 for sale

VEECO / DEKTAK AP 150 is a versatile high accuracy, portable surface profiler capable of measuring step heights to 1 nano meter for semiconductor processing and device metrology. It is designed with enhanced sensitivity and advanced features to perform non-destructive surface measurements and profiling operations for chip level detector interconnect, bump, and flip chip metrology. VEECO AP 150 is equipped with a telecentric zoom lens to enable precise measurements of feature edges, step heights, and other surface topography parameters. Its large telecentric zoom range allows it to image and measure features down to 1nm in total height DEKTAK AP 150 utilizes two vertical and one horizontal scanning axis to provide a large working distance with a maximum image field width of 250mm. Additionally, it is equipped with 180 nm vertical and 0.75nm horizontal resolution and equipped with a maximum scanning speed of 1.5 mm/second. It also comes with a USB port communication system and can be connected to an external monitor for display. AP 150 is used for metrology of wafers and semiconductor chips, as well as for multilayer device characterization, and is capable of measuring nanoscale features and structures on a variety of substrates. This allows it to be used for a variety of applications such as MEMS and microelectronic design. It is also well suited for measurement of sub-micron surfaces, for scanning electron microscope (SEM) applications, and for scanning probe microscopy (SPM). The device also offers enhanced performance features such as repeatable measurements, blue illumination, non-contact sample determination, and long-term stability through automatic filter control. Furthermore, the non-contact sample selection system prevents scanning artifacts caused by surface contamination. Additionally, it is also compatible with various vacuum transfer and loading systems to expand its application range. In a nutshell, VEECO / DEKTAK AP 150 is a reliable, accurate, and versatile option for precision metrology and non-destructive surface profiling. It offers a powerful combination of features that makes it an ideal choice for a wide range of applications in areas such as wafer metrology, semiconductor device characterization, and MEMS and microelectronics design.