Used ZYGO NewView 5000-5032-DS #9269321 for sale

ZYGO NewView 5000-5032-DS mask and wafer inspection equipment is an advanced optical metrology tool designed for high-precision non-destructive inspection of semiconductor photomasks and wafers. Utilizing advanced optics, lasers, and electronics, the system offers an array of advanced features and capabilities to help uncover defects that may otherwise go unnoticed. The unit consists of a cryogenically cooled 2-megapixel RGB CCD camera with 45-degree viewing angle, static and dynamic image capture, autofocus and a backlight illumination unit. This enables a maximum field-of-view size of up to 25mm x 25mm. It is paired with a fast and highly effective X-Y motion machine with a Z drive allowing for nanometer-level graphical measurements. An image-stabilization tool (ISSMPC) is also incorporated to ensure accurate results under measurement conditions where outside stabilized factors may be causing constant scan shifts due to vibrations or other environmental factors. The asset is capable of working with either high-definition RGB color signals or normal mono signals. It also provides support for both digital and traditional analogue optical filters. Additionally, precise digital data corrections can be applied directly to the scanned image to improve measurements. ZYGO NEWVIEW 5000 5032-DS utilizes its advanced optics to detect even the smallest features such as scratches, spots, and dust particles and can detect even smaller than the visible features on a semiconductor. It is designed to facilitate the inspection of high-pixel density wafers and masks down to 90nm by utilizing stereo imaging, phase-shifting interferometry, fringe projection and light intensity comparison. It can also detect mura and thin-film defects. To ensure accuracy and consistent results, the model utilizes a unique feature called "Standard Silicone Reference Chip" which allows for the inspection of multiple different chip types and processes. Furthermore, ZYGO in-depth analysis software, GOTO (Geometric Testing Equipment), helps to identify and analyze defects deeper than traditional metrology systems. It also helps in identifying patterns for defective wafers and masks before they make it into production. NewView 5000-5032-DS is a reliable and widely-used system for providing accurate results for any mask or wafer inspection. This advanced metrology tool enables engineers and scientists to uncover the tiniest of defects, thereby helping to reduce wafer and mask production costs.