Used ZYGO NewView 5000 5022 #9203844 for sale

ZYGO NewView 5000 5022 is a high-performance mask and wafer inspection equipment designed for precision measurement of IC structures in semiconductor wafers. The system is capable of inspecting both wafer mounting frame structures as well as sidewall structures. The unit consists of a high-resolution imaging path, including a low-noise CCD imaging array, an optical microscope, and imaging optics. The imaging optics machine includes an objective lens, a dichroic filter, and a fixed magnification of 0.25X to 5X. The imaging path is designed to provide excellent contrast sensitivity and high levels of detail while minimizing background image noise. The tool also features automated focus and image stitching to ensure a consistent image across the wafer. For complex defect detection, the asset offers a wide range of automated contrast enhancement tools, including sharpening filters, binarization, and smoothing. The model also features a range of inspectability analysis tools, including a pattern recognition tool that can detect defect types such as oxide line defects, missing circuit elements, and transverse oxide cracks. Additionally, the equipment includes a 3D inspector to accurately measure sidewall profile and geometrical distortions. The 3D inspector also offers a critical dimension measurement, which assesses the accuracy of sidewall dimensions in a single pass process. The system has an integrated measurement and analysis screen which provides users with the ability to analyze their inspection results. The analysis screen allows users to set specific tolerances for inspection parameters and obtain an accurate report on the overall baseline performance of the inspected wafers. Additionally, the unit allows for the comparison of sample ICs across multiple wafers to ensure a consistent performance. To meet industry requirements, the machine is compliant with a range of international standards, such as the latest ISO9000 guidelines. The tool also comes with built-in security and traceability features, which ensure data privacy and traceability when performing measurements and inspections. Overall, NewView 5000 5022 is an advanced mask and wafer inspection asset which is designed to provide excellent contrast sensitivity and detail detection, automated focus and image stitching, 3D inspection for sidewalls and critical dimension measurement, as well as a range of analysis and reporting features. The model is compliant with international standards and offers a range of traceability and security features, making it ideal for fabrication, inspection, and quality control in the semiconductor industry.