Used ADE / KLA / TENCOR NanoMapper #293706156 for sale

ADE / KLA / TENCOR NanoMapper is a next-generation X-ray inspection and metrology equipment for nano-scale analysis. The system is capable of providing high-resolution images with a varying range of resolution depending on the type of sample and purpose. It is also equipped with advanced algorithms to analyze the generated images for accurate measurements and feature detection. ADE NanoMapper consists of several components that enable X-ray imaging and analysis: an X-ray source, a detector, and a beamline unit that directs the X-rays onto the sample. The X-ray source emits X-rays with a wide range of energies and can be adjusted to acquire images with greater resolution or capture images with higher contrast. With KLA NanoMapper machine, users can adjust the energy and wavelength of the X-ray beam to capture images as thin as 1nm in resolution. Combined with the detector, it enables NanoMapper to capture minuscule features such as nanoparticles and nanostructures. The beamline tool allows users to control the angle of the X-ray beam in relation to the sample, further increasing the resolution of images. Images can be captured from various angles to enable 3D analysis. To further aid in analysis, TENCOR NanoMapper is installed with a suite of proprietary software to analyze generated images. With this software, users can measure critical features in the design and analyze the structural integrity of samples. Using ADE / KLA / TENCOR NanoMapper, images can be captured quickly and accurately; offering repeatable and highly variable image processing capabilities for both inspection and metrology needs. It can be used in a wide range of industries such as semiconductor, pharmaceutical, and automotive due to its precise imaging capabilities, making it an invaluable tool for nano-scale studies.