Used ADE / KLA / TENCOR NanoMapper #9235752 for sale

ADE / KLA / TENCOR NanoMapper is a powerful x-ray equipment capable of imaging samples on the nanometer scale. The system uses state-of-the-art scanning technology to produce high-resolution images with up to 1 nanometer resolution. ADE NanoMapper provides comprehensive analysis of a sample's surface morphology and composition. KLA NanoMapper's innate integrated detector is capable of capturing high-sensitivity images over a wide range of x-ray energies from 5-50 keV. This enables operators to create multi-energy composites to identify changes in relative composition or contrast on the sample's surface. The unit uses a high-speed x-ray generator and a linear motor travel machine that offers precise control over the scan field. This allows for uniform, ultra-precise scans with minimal defocus. These scans are also fully programmable, allowing for accurate capture and analysis of data from any target area. TENCOR NanoMapper also includes an extensive suite of software tools, such as the particle analysis package that enables advanced particle size and shape analysis. In addition, the morphology analysis module can display the sample's surface roughness, interface topography, and overall dimensional accuracy profile. NanoMapper has several features that make it ideal for researchers in fields such as semiconductor technology, microelectronics research, nanomaterials, and life sciences. For example, by making use of the fast specimen holders, the tool can quickly collect thousands of data points in a fraction of the time needed for typical x-ray instruments. Additional advanced features include automated exposure time decisions, user-controlled stitching for large-format field of views, and fluorescence imaging capabilities for particle identification and positioning. ADE / KLA / TENCOR NanoMapper also includes automated image alignment and distortion correction. ADE NanoMapper is truly a versatile instrument that offers an unmatched level of accuracy and precision for nanoscopic analysis. By combining the highest resolution imaging with comprehensive software analysis tools, users are able to review their data quickly and accurately.