Used BRUKER-AXS AXS D8 Discover #9285106 for sale
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ID: 9285106
Vintage: 2012
X-Ray Diffraction (XRD) system
Scope of supply
D8_A01_2: D8 Discover
D8_A02_F:
Theta
Long track
Vertical, 8"-10"
D8_A03_R, 10"
Tube mount
(2) DOF-ROOT
Window
D8_A04_1: With enclosure
D8_A05_9:
With cabinet
3 kW Generator
Internal water
Water cooling unit
D8_A06_1:
Power supply:
220 V / 230 V / 240 V
50/60 Hz
D8_P27:
Sealed Gobel Mirror Asymmetric Channel Cut monochromator module (GM-ACC)
D8_B38:
Rotary absorber for D8
(4) Positions
Primary beam path mounting G
Bel mirror housing
T62:
UMC 1516
Motorized XYZ-Phi-Chi drives
4" / 4" / 2"
Unlimited turns
Tilt: -5° to +55°
Respectively
(5) Ports of 4-axis
D8 Theta and theta 2R: Motor driver board
D8_T57:
Diffracted beam slit assembly
2.5° Soller slit
D8_S01:
Pathfinder triple bounce
Dual beam path analyzer module
Height, 8"
D8_S45:
Dynamic scintillation detector
Nal
D8_D01:
Ceramic tube KFL Cu 2K
Long fine
2.2kW Cu
SLD 450:
Modification of UMC 1516, 6" / 6" / 2"
Turns: -5° to +5°
Tilt: -5° to +55°
Respectively
(5) D8 4-axis motor driver board
2R Theta / Theta
DEL-PCPENT-STD-INT:
D4 and D8 DIFFRACplus Measurement center diffractometer
P100A100: DIFFRACplus Evaluation
7KP72008AR:
DIFFRACplus LEPTOS H
Miscellaneous:
Detector mounting flange with slit reception
D8_V40: Mount for UBC pin hole collimator (height, 8")
D8_K08: Ni filter for Cu-K Radiation
D8_B05: Plug In slit 6 mm
(2) D8_B50: Plug In slit 2 mm
(2) D8_B51: Plug in slit 1.5 mm
(2) D8_B52: Plug In slit 1.2 mm
D8_B53: Plug In slit 1 mm
(3) D8_B54: Plug In slit 0.6 mm
(3) D8_B56: Plug In slit 0.2 mm
(3) D8_B58: Plug In slit 0.1 mm
(2) D8_B59: Reference crystal for HRXRD
D8_T37: H258 Long spacer optics
D8_S27: H258 Spacer detector
D8_S30: Riser for optics, 8"-10"
D8_S46: Detector interface board
D8_E01: 4-axes motor driver board
(2) D8_E03:
D8 Counter balances
Tube and detector circle
D8_V50: Diagonal slit
C79298A3158B90:
Short riser optics, 8"-10"
(20) C79298A3244B159:
Vario interlock, 8"
A18B35
2012 vintage.
BRUKER-AXS AXS D8 Discover is an advanced x-ray diffraction (XRD) equipment designed for the study of crystalline materials. The system is based on the Bruker D8 advance platform, which has long been used in research and in industry applications for the characterization of crystalline materials. The unit is equipped with a high-resolution two-dimensional imaging detector and an incident-beam optical monitor, to provide both diffracted x-ray intensity and sample orientation information in a single measurement. The machine works by emitting x-rays onto the sample, which diffract off of the crystalline structure, producing an x-ray pattern. The intensity of this pattern is related to the number and orientation of the crystallites within the sample. This pattern can then be used to analyze the structure and composition of the sample. The tool can be used to characterize materials such as metals, ceramics and polymers. The asset is capable of automated operation and can be used for both single- and multi-sample measurements. The sample is set in a holder, which is moved onto the rotation stage and aligned with the incident x-ray beam. The sample can then be moved in several directions to make single or multiple measurements. The model is also equipped with a motorized vertical stage for automated sample movement. The equipment's software comes with a variety of analytical tools to assist the user in data collection and interpretation. Features such as the indexing and identification program provide assistance with identifying the material under investigation and properly indexing the x-ray pattern. The orientation refinement can help to accurately determine crystalline structure parameters, while a pattern matching program can provide assistance with the comparison of patterns. BRUKER-AXS D8 DISCOVER is designed to provide both fast, repeatable measurements for routine quality control, as well as detailed analysis for research and development applications. With its advanced features and flexibility, the system provides excellent results and can help to significantly enhance the characterization process.
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