Used BRUKER D8 Advance #293617931 for sale

BRUKER D8 Advance is an advanced X-ray Diffractometer equipment for the purpose of analytical X-ray characterization. It is composed of D8 Advance X-ray generator with a patented miniature flat-lens X-ray optics and X-ray detector with dynamic range extension, and the D8 Structure Analyzer. The D8 Structure Analyzer is a sophisticated system application that allows users to conveniently analyze, evaluate and interpret their acquired X-ray data. BRUKER D8 Advance X-ray generator is built upon an advanced X-ray tube and a Lithium Niobate monochromator that can provide a beam of high-resolution X-ray photons in the range of 1 to 100 nm photons. It is equipped with advanced flat-lens X-ray optics that are designed to minimize the divergence of the X-ray beam and to accurately focus the beam on the sample. It also has a new small-angle X-ray diffraction (SAXD) detector that provides dynamic range extension and a high level of precision in the results acquired. The D8 Structure Analyzer is an application which includes modules for X-ray diffraction, texture and pole figure measurement, full-field dark-field imaging (FFDI) and full-field bright-field imaging (FFBI). It also allows users to perform simulations, such as X-ray reflectivity (XRR) patterns, Debye-Scherrer rings, and Wulff analyses. It has features such as auto-identification of diffraction peak positions, and an extensive data analysis library for 2D, 3D and 4D data analysis. D8 Advance X-ray unit can be used to characterize the properties of materials, such as microstructure, phase composition, crystal structure, mechanical properties, and temperature. It is capable of detecting differences in the orientation and microstructure of samples, and can also be used to measure strain, stress, and phase transitions on the nanometer level. In summary, BRUKER D8 Advance is a powerful X-ray Diffractometer machine, composed of advanced X-ray generator and analyzer units, which is used for advanced X-ray characterization purposes. Its unique X-ray optics, detector, and sophisticated data analysis functions, provide reliable and detailed results that can be used for a wide range of materials characterization applications.