Used BRUKER D8 Advance #9212881 for sale
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ID: 9212881
Vintage: 2013
X-Ray diffractometer
To analyze thin layers (Thickness: 10 nm< >30 μm): LiCo O2 and other based Li materials
Protective enclosure with ergonomic access to experimental area
Cu X-ray tube
THETA Vertical goniometer to measure horizontal sample
Goniometer angular mode range: 0°-140°
Focusing and parallel beam geometry
Parameters measurement conditions and optics
Detect differences between parameters and required parameters in the recipe
Measure decoupled mode used in bragg brentano geometry
Detector used in 0-D mode
X,Y, Z Motorized sample stage managed with Z movement up to 25 mm
Optimized system for fast and accurate sample positioning with no limitation of angular range
Axial soller slits for intensity and peak profile optimization
Optics package for parallel beam with two secondary optics
Masks set to adjust the beam footprint in both geometry (Bragg brentano and parallel beam)
Sealed cell to perform X-ray diffraction in inert atmosphere
High resolution linear detector with high count rate
Energy discrimination and low background noise
For alignment system and parallel beam geometry
Fluorescence and Kbeta artifact suppression without secondary monochromator
Optimized acquisition time
Multi users access level: Operator and engineering mode
Integrated chiller system to ensure X-ray tube integrity
Includes:
Goniometer
Detectors
Tube type
Hours on tube
2013 vintage.
BRUKER D8 Advance is a high-performance x-ray diffraction (XRD) equipment equipped with modules, accessories, and software for a wide range of advanced X-ray diffraction applications. The system is designed for the characterization of materials. It operates in three-circle diffraction mode, which makes it suitable for analyzing crystalline samples and non-crystalline materials. The unit includes an X-ray source, a detector assembly, a sample holder, and an optically isotropic sample stage. The X-ray source is designed to provide specific bandwidths and wavelengths for specific applications. The detector assembly is configured to enable sensitive detection of X-ray diffraction data across the range of angles of interest for crystallographic characterization. The sample holder includes a wide range of devices for holding various samples, including oriented single-crystals, powder samples, and liquid cells. The optically isotropic sample stage is an essential component of the machine, allowing precise positioning of the sample in relation to the X-ray beam. The tool is optimized for flexible imaging and ab-initio data collection of a wide variety of samples. D8 Advance is powered by a range of software applications that enable advanced controls of all aspects of the asset. The software applications provide the user with extensive tools for sample alignment, data acquisition, data analysis, texture analysis, and sample preparation. The software supports integration with many other data acquisition and analysis tools, such as 10x Detector+, PowderCell+, and 3D reconstruction packages. BRUKER D8 Advance includes options for automated calibration and rapid sample exchange, as well as a wide range of post-processing functions, such as peak fitting and crystallite size determination. D8 Advance offers significant advantages over other XRD systems, including excellent stability and accuracy of data collection and analysis under varying conditions. It is also designed to be compact, easy to use, and extremely sensitive. BRUKER D8 Advance is an ideal solution for a wide range of XRD applications in research and industrial laboratories.
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