Used BRUKER D8 Advance #9268618 for sale
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ID: 9268618
Vintage: 2013
X-Ray Diffractometer (XRD)
Power supply: 208-240 V, 40 A, Single phase
2013 vintage.
BRUKER D8 Advance is a top-of-the-line, state-of-the-art X-ray equipment for X-ray diffraction and X-ray fluorescence analysis. It is primarily used for materials research, and is an excellent tool for understanding the structure and composition of materials. The system is equipped with an anti-reflective-coated X-ray source and various detectors, including a high-resolution Area Detector and an exchangeable Generator Set. It also includes a range of sample environment options, such as an inert gas atmosphere at any given pressure, a choice of samples holders, as well as a high net power thin film crystallization (TFX) sample environment. The unit is also highly customizable to specific user needs. D8 Advance is driven by a Windows PC, and the software supplied is extremely user-friendly, allowing for simple data and instrument control. The machine has various measurement modes available, such as small-angle scattering (SAS) measurements, differential scanning calorimetry (DSC) and dynamic mechanical analysis (DMA), as well as automated in-plane and out-of-plane angle scans. The X-rays are generated with a micro-focus source that is kV-stabilized, enabling the highest total resolution currently available in a wet laboratory tool. Furthermore, BRUKER D8 Advance provides improved angular resolution with the use of a small-spot detector, which is ideal for measuring strongly focused X-rays. The sample environment is also extremely flexible, providing measurements in a range of inert gases at an extremely low pressure. The available sample holders are extremely versatile, and can accommodate almost any kind of sample. Overall, D8 Advance provides unparalleled performance on almost any kind of material. By combining efficient sample holders, BRUKER unique X-ray sources and detectors, and an intuitive software package, BRUKER D8 Advance provides unmatched performance and control for materials research.
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