Used BRUKER-AXS AXS D8 Discover #9121596 for sale
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ID: 9121596
Vintage: 2005
X-Ray diffraction system
Theta / theta
Hi-Star area detector
Polycap for parallel beam
Centric eularian cradle
Laser / Video microscope
GADDS Plus suite
Diffract + stress analysis software
Diffract + search
ICCD / PDF4
4 PF Specimens in single set-up
Multex software suite
Stress analysis capable with "Leptos" software
Phase analysis
EVA Phase identification and quantitative analysis
Laser specimen "Z" alignment and associated camera
X,Y,Z Stage 40mm, 40mm, 8mm movement
CukAlpha source and polycap on incidence side
No chiller or additional power supplies included
EVA ver10.0
GADDS V4.1.42
Leptos 6.02
D8 3.07
Multex area (Pole figure program)
Large eularian cradle
Laser / optical specimen alignment
2005 vintage.
BRUKER D8 Discovery is a X-ray diffractometer equipment which is used to measure and analyze the crystalline structure of materials. It is a premier tool for the characterization of materials such as compounds, semiconductors, metals, and ceramics. The system uses diffraction to study crystallographic properties such as phase composition, cell parameters, and lattice spacings. The unit is equipped with a two-dimensional (2D) imaging and spotfinding machine, a rotating anode X-ray source, and a highly sensitive CCD detector. The 2D imaging tool allows for precise alignment of the sample on the goniometer and detection of elemental composition. The X-ray source is optimized for high performance and produces a beam with strong intensity and low divergence. The spotfinding asset analyzes the images and provides feedback on the crystallinity, orientation, and relative orientation of the sample. The CCD detector is removable and exchangeable with other external detectors for different diffraction geometries. The detector has a fast readout speed and offers outstanding resolution. The detector's advanced design enables high-resolution patterns to be acquired with minimized background noise. The model also offers intuitive software to control the equipment and to analyze the patterns. The software provides a wide range of instrumentation functions, including sample loading, data acquisition, and data analysis. It also offers a comprehensive graphical user interface to optimize the instrument setup, data acquisition, and pattern analysis. D8 Discovery is a powerful X-ray diffractometer system for advanced material characterization. The unit is capable of providing high-resolution X-ray diffraction patterns to characterize the crystallinity of a wide range of materials. It is a robust instrument, designed for operation in the lab and in the field. It is easy to use and maintain and offers excellent resolution, spotfinding capabilities, and intuitive software features. BRUKER D8 Discovery is an excellent tool for scientists and engineers working on the development of new materials.
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