Used BRUKER-AXS AXS D8 Discover #9133963 for sale

BRUKER D8 Discovery is a x-ray spectrometer equipment designed for characterization of chemical and physical properties of materials for research, quality control, and other applications. The system consists of a X-ray source, sample area, and detector. The X-ray source provides a monochromatic and collimated X-ray beam to probe the sample. The sample area is fitted with a sample holder, such as a sample holder with vertical and horizontal alignment capabilities, for positioning the sample of interest. The detector is used to collect and record the emitted X-rays. The detector can be a combination of a detection crystal and scintillation counter or a position-sensitive detector such as a Gas-filled proportional counter, Permanently Collimated scintillation counter or a semiconductor-based multi-channel plate detector. D8 Discovery unit is capable of performing a wide range of X-rays analysis techniques including single crystal X-ray diffraction, powder X-ray diffraction, X-ray fluorescence (XRF), X-ray reflectivity (XRR), X-ray diffraction topography, X-ray photoelectron spectroscopy (XPS), and absorption measurements. Single crystal X-ray diffraction is used to determine the structure of a sample by measuring the angular positions of the diffracted X-ray beam. Powder X-ray diffraction is used to obtain information on the crystallographic structure, chemical composition, and phase of a sample. X-ray fluorescence is used to determine the elemental composition of a sample. X-ray reflectivity is used to measure the electron density profile of a sample. X-ray diffraction topography is used to measure the surface morphology of a sample. X-ray photoelectron spectroscopy is used to measure the chemical composition and electronic states of a sample. Finally, absorption measurements are used to quantitatively measure the changes in absorption due to changes in a sample property, such as concentration, density, or refractive index. By offering a flexible user interface, BRUKER D8 Discovery machine makes it easy for the user to configure and operate the tool for a variety of X-rays analysis techniques. The asset is also capable of automatically collecting data and providing real-time feedback. D8 Discovery is suitable for a variety of materials analysis needs, from structural characterization to quality control. This highly versatile model provides an excellent platform for scientists and researchers to investigate physical and chemical aspects of materials.