Used BRUKER NANOSTAR #9235860 for sale
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ID: 9235860
Vintage: 2013
Small Angle X-Ray Scattering (SAXS) system
Non-destructive: Investigation of 3 dimensional structures
Part number:
7KP28028MA
862-063701
862-842800
862-829400
PM1000
Part number: C79298A3158B46
Plug-in slit, 6 mm
Part number: 862-062201
Fe55 Calibration source
Part number: P5000110
Set of ten built-in nano particle models:
Basic geometrical models (Spherical, spherical shell, ellipsoidal, cylindrical)
Selected polymer models (Flexible and semi-flexible chains, gaussian star, spherical block copolymer micelle)
Tabletop:
(2) Stable granite tablets
Tabletop dimension: 3540 x 950 mm
Collimation system:
Diameters and distances:
Pinhole 1: 750 μm
Pinhole 2: 400 μm
Pinhole 3: 1000 μm
Distance pinhole 1 - Pinhole 2: 925 mm
Distance pinhole 2 - Pinhole 3: 485 mm
Copper anode
Power: 45 kV at 0.65 mA
Integrated MONTEL optics:
Length: 60 mm
Output divergence: 1 mrad
Output beam dimension: 0.64 mm
Output flux: 2 x 10^7 cps
Radiation tight housing with be-entrance and exit window enabling evacuation
(4) Manual setting screws
XL Sample chamber:
2-Dimensional VANTEC-2000 detector with mounting base
Beam path tube of 400 mm length with mounting base
Beam stop frame with two beam stops of 4.31 mm and 3.15 mm diameter
VANTEC-2000 Detector
True photon counting X-ray detector
Wide energy range: 4 keV up to 12 keV
Active area: 140 mm x 140 mm
Usable wavelength range: Cr-Ka to Cu-Ka (Factory set for Cu-Ka)
Energy resolution: <25 %
Operational mode:
2048 x 2048
1024 x 1024 / 512 x 512 Channels
Pixel size: 68 μm x 68 μm
Spatial resolution: < 100 μm RMS
Maximum global count rate: 10^6 cps
Maximum local count rate: 3 x 10³ cps/pixel
Background noise: < 5.0 10^-4 cps/mm²
Operational gas: Xe-CO2
Operating conditions:
Temperature: 15°C - 30°C
Humidity: Up to 80 % RH
Frame buffer:
Dedicated frame buffer PC
With proprietary parallel detector interface
Mouse and keyboard
Capacity of disk drives and CD-RW, DVD-ROM, hard disk
RAM: State of the art
User selectable frame display
Real color display of data
Graphical evaluation of one-dimensional data sets:
Display and comparison of measured and simulated data
Simple, interactive evaluation of SAXS measurements
Wide selection of commonly used axis scaling
Automatic fitting:
Different refinement methods for automatic evaluation:
Levenberg-Marquardt
Online display of intermediate results (Text and graphic)
Particle size distribution and change of c2 cost function
2013 vintage.
BRUKER NANOSTAR is an X-ray equipment developed by BRUKER, a global leader in the X-ray industry. It is designed for nondestructive analysis of research, industrial and aerospace samples, providing nanometer-scale measurements of internal and surface structures. NANOSTAR system utilizes a unique combination of X-ray source and detection components, allowing it to acquire 500 nanometer resolution images even in low-dose imaging environments. The X-ray source is a highly focused cobalt-60 beam which is precisely directed onto the sample, while avoiding other components of the unit. This feature ensures excellent sample imaging and the ability to acquire detailed images with the correct dose. BRUKER NANOSTAR machine also features advanced data collection, image processing and analysis capabilities. Data can be acquired and stored in multiple formats, enabling rapid data analysis. Image processing tools can be used to enhance resolution and contrast, enabling the user to effectively examine features at the nanometer scale. Additionally, built-in analysis tools can be used to measure shape, size, porosity and other properties of the sample. NANOSTAR X-ray tool is a powerful tool for nondestructive analysis of a variety of research, industrial and aerospace samples. The high resolution imaging and powerful data processing capabilities enable detailed inspections and analyses of complex sample structures in a minimally invasive manner. With its unique combination of X-ray source and detection components, BRUKER NANOSTAR asset stands as a leader in the industry for X-ray nondestructive analysis.
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