Used FISHER SCIENTIFIC XDL #9359052 for sale

FISHER SCIENTIFIC XDL is an advanced X-ray diffraction equipment designed for high-resolution analysis of a range of materials. It consists of a monochromator, a computer-controlled chamber, and a detector. The monochromator is adjustable and enables the selection of specific wavelengths for analysis. The computer-controlled chamber ensures optimal environmental conditions for sample preparation and analysis. The detector is used to measure the X-ray diffraction pattern resulting from the reflected radiation. The main component of XDL is the X-ray tube. This is a sealed evacuated tube containing an anode and a filament. When a voltage is applied to the anode, electrons are emitted from the filament and accelerated towards the anode. When electrons collide with the anode, they release X-rays, which are then carefully directed at the sample. This X-ray radiation is then diffracted by the sample before being reflected from it. This diffracted radiation is detected and measured by the detector. The system also includes a sample holder and a collimation unit. The sample holder enables precise positioning of the sample prior to analysis. The collimation machine reduces background radiation and ensures that only X-rays of the selected wavelength are used for analysis. This is important for ensuring accurate results. The tool also includes a sample rotation unit, allowing the sample to be rotated in steps of 0.1 degree. This allows for the correct orientation of the sample for X-ray diffraction analysis and enables the investigation of all planes in a crystal structure. The asset software includes a range of features, including a user-friendly graphical interface, saving of data and a library of pre-defined sample settings. FISHER SCIENTIFIC XDL is capable of providing high-resolution X-ray diffraction with sensitivity and accuracy allowing for the identification and analysis of a range of materials. It is therefore suitable for both research and industry-level applications. In summary, XDL is a highly advanced X-ray diffraction model, allowing samples to be rapidly and accurately analyzed.