Used FISHER SCIENTIFIC XDLM #9378146 for sale

FISHER SCIENTIFIC XDLM is an x-ray diffraction and small angle scattering equipment that is designed to provide high-performance, reliable, and energy efficient x-ray measurements. The system is a complete unit incorporating two-dimensional spectral analysis, advanced signal processing, and data management capabilities. The machine uses a high-performance computer tool with two-dimensional image analysis software to provide precise analytical measurements of low angle x-ray diffraction and small angle scattering. The spectroscopy is based on a reliable optical asset utilizing an optimized crystal form of a single crystal model, which is used to enhance the spectral efficiency and resolution of the data. The equipment also features data acquisition and storage in both analog and digital formats, providing flexibility and ease of use. For sample measurements, XDLM uses a high intensity x-ray source that is coupled to a monochromator for spectral characterization and a detector for precise measurements. The detector is designed with an enhanced rate of detection to provide accurate measurements and data collection. The system also incorporates advanced signal processing techniques to reduce the noise level and optimize the signal to noise ratio. In addition to the x-ray source, monochromator, and detector, FISHER SCIENTIFIC XDLM can be interfaced with an integrated unit of optics, software, and a compressor capable of delivering purified, vacuum-sealed gas-discharge sources in a safe manner. The compressor provides a variable pressure-controlled delivery machine while the software is capable of controlling a wide range of x-ray parameters. For data acquisition and analysis, XDLM provides a powerful tool for real-time data acquisition and analysis. The asset features automated particle identification, tracking, and data integration, making it a flexible and user-friendly data acquisition model. The equipment is also capable of recording and analyzing data from multiple sources, allowing for simultaneous operation and analysis. In addition to data acquisition and processing capabilities, FISHER SCIENTIFIC XDLM provides a comprehensive suite of software to enable the analysis of data. This includes features for data interpretation, automation, and visualization of results. Furthermore, it offers a variety of data analysis features including parameter estimation, linear and nonlinear regression analysis, and error analysis. In conclusion, XDLM is a robust and reliable x-ray system designed for accurate diffraction and small angle scattering analysis. It features advanced signal processing and data analysis capabilities, as well as a wide range of features for data acquisition, processing, visualization, and analysis. The unit provides excellent quality and accuracy of results and makes it an essential instrument for any laboratory.