Used GE PHOENIX Nanomex 160 #293795179 for sale
URL successfully copied!
Tap to zoom
ID: 293795179
Vintage: 2005
X-Ray system
Geometric magnification: Up to 2130x
Total magnification: Up to 13300x
Detectability: 200 nm - 300 nm
Contrast resolution: Down to 0.5%
Imaging Mode: 2D
Feature recognition: 400nm to 0.4µm
X-Ray tube:
Type: Open tube
Transmission head
Cone angle: 170°
Filament: Tungsten hairpin
Maximum tube voltage: Up to 180 kV
Maximum tube Power: Up to 50 W
Open tube сonfiguration
Operating hours: under 100
High-power nanofocus tube:
Voltage: 160 kV
Power: 50 W
Detectability: 200 - 300 nm
Dual mode nanofocus tube:
Voltage: 100 kV / 160 kV
Power: 20 W
Detectability: 200 - 300 nm
Vacuum system:
Oil-free turbo molecular pump
Roughing pump
Manipulator:
X Scanning area: 460 mm x 360 mm
Y Scanning area: 610 mm x 510 mm
Maximum sample size: 680 mm x 635 mm
Maximum sample weight: 5 Kg
View angle: 70°
Rotation: 0° to 360°
Axis speed: 10 microns/sec to 8 mm/sec
Control:
Joystick control / Mouse
CNC
Detector:
Dual-field image intensifier, 4"
Digital camera, 2 MP
TFT Display, 20"
16-Bit digital a-Si diode array detector
Manipulation:
Oblique view: 0° to 70°
Tilt: ±30°
Rotation: 360°
CT:
Geometric magnification: 200x
Resolution: Down to 2 µm
2005 vintage.
GE PHOENIX Nanomex is an x-ray equipment designed specifically for rapid nanoscale and nanometer-scale analysis. By using a specialized nano-detection unit, the PHOENIX Nanomex is able to detect phenomena occurring on a nanometer-scale. It features a short pass energy filter that allows users to get precise measurements of nanomaterials, allowing them to obtain insight into their properties. GE PHOENIX Nanomex system includes a field emission electron microscope (FEM) and a flexo-x-ray source, which are designed to work together to maximize performance. The FEM uses electrons to produce high-energy images of nanomaterials in ultra-high resolution. The flexo-x-ray source produces x-rays from a variable-strength emission source, allowing users to adjust the energy and intensity to best suit their particular analysis application. The combination of the imaging tools produces superior nanoscale imaging, and image acquisition speed is greatly enhanced due to the x-ray unit's ability to generate images with exposure times several orders of magnitude shorter than those from an optical microscope. Additionally, the machine can detect and measure a wide range of properties including various kinds of stress and strain, electrical properties, and microstructural information. Nanomex tool is equipped with an easy-to-use software suite for image analysis and post-processing. This suite includes features that support multiple 2D and 3D image analysis, quantitative analysis, and surface reconstructions. It also enables users to export results in multiple formats, including jpeg, tiff, and avi, and provides statistical modeling tools. In conclusion, GE PHOENIX Nanomex is an ideal tool for those in need of nanoscale and nanometer-level analysis. It combines powerful imaging tools with a convenient software suite that allows precision, speed, and automation of image acquisition. Featuring a wide range of features and abilities, it can be used across multiple applications, including in materials research, semiconductor production and inspection, and medical research.
There are no reviews yet