Used HITACHI / OXFORD X-Strata 920 #293763261 for sale

HITACHI / OXFORD X-Strata 920 is a cutting-edge x-ray fluorescence (XRF) equipment that is designed specifically for thin film analysis in a wide range of industries and applications. This advanced instrument combines the sophisticated technology of OXFORD with the expertise of HITACHI Instruments to provide accurate, reliable, and high-performance thin film analysis capabilities. At the core of OXFORD X-Strata 920 is its x-ray excitation source, which generates a high-intensity x-ray beam that is focused on the sample under investigation. This x-ray beam interacts with the atoms in the sample, causing them to emit characteristic x-ray fluorescence signals that are detected and analyzed by the system. By measuring the energy and intensity of these fluorescence signals, HITACHI X-Strata 920 can determine the elemental composition and thickness of the thin film with exceptional precision and sensitivity. One of the key features of X-Strata 920 is its versatility and flexibility in accommodating a wide variety of sample types and sizes. The unit is capable of analyzing samples ranging from nanometer-thin films to thick multilayer structures, making it suitable for a diverse range of applications in industries such as semiconductor manufacturing, materials science, electronics, and coatings. HITACHI / OXFORD X-Strata 920 is equipped with advanced software that allows for automated data acquisition and analysis, enhancing productivity and efficiency in the laboratory. The software provides user-friendly interfaces for setting up experiments, calibrating the machine, and interpreting the results, making it easy for operators of all skill levels to use the instrument effectively. In addition to precise elemental analysis, OXFORD X-Strata 920 offers advanced thickness measurement capabilities, allowing users to accurately measure the thickness of individual layers in a multilayer sample. This capability is invaluable for quality control, process optimization, and research and development in industries where the thickness of thin films is critical to performance. HITACHI X-Strata 920 is designed with robustness and reliability in mind, featuring a rugged construction that ensures stable performance over extended periods of use. The tool is also equipped with advanced safety features to protect operators from exposure to x-ray radiation, ensuring a safe working environment in the laboratory. Overall, X-Strata 920 represents a state-of-the-art solution for thin film analysis, offering unparalleled accuracy, sensitivity, and versatility in a compact and user-friendly package. Whether in academic research, industrial quality control, or process development, HITACHI / OXFORD X-Strata 920 is a powerful tool that delivers precise and reliable results for a wide range of thin film analysis applications.