Used KLA / TENCOR NANOMAPPER #9205607 for sale

Manufacturer
KLA / TENCOR
Model
NANOMAPPER
ID: 9205607
Wafer inspection system, 12" 2006 vintage.
KLA / TENCOR NANOMAPPER is a state-of-the-art x-ray inspection equipment designed to analyze submicron features within the dielectric material of a sample. This system utilizes innovative x-ray optics and proprietary image processing algorithms to create high-resolution, cost-effective defect analysis for complex and challenging materials. KLA NANOMAPPER is designed to generate high-resolution images of the structures contained in materials less than 1 micron. By using x-ray optics and proprietary image processing algorithms, this unit allows for automated defect analysis and defect sizing on the micro- and nano-scale of nonconductive materials. The machine consists of two distinct parts: the optical imaging and the image processing. The viewer uses a special ultra-short pulse laser to acquire high-resolution images of the structures within the dielectric material. The laser pulse is adjusted to the characteristics of the sample material, allowing for an optimized imaging resolution and exposure time. The image processing part of the tool uses proprietary algorithms to detect and quantify any defects or material flaws detected by the imaging asset. These algorithms apply sophisticated edge detection, particle size, and material identification techniques to identify and highlight defect features across the spectral range of the x-ray imaging model. Beyond correctly identifying defects, the algorithms can also measure the size, shape, and severity of the occurring flaw. This allows users to quickly identify issues within dielectrics that cannot be spotted by the naked eye. TENCOR NANOMAPPER is an ideal solution for those looking for accurate and repeatable defect analysis in non-conductive material less than 1 micron. By combining unique laser imaging and proprietary edge detection techniques, the equipment provides a high-resolution window into the microscopic world that can be easily analyzed and quantified. The system is also easy to use, requiring minimal setup and operator knowledge to perform multiple analyses in a short period of time. With a focus on both accuracy and speed, NANOMAPPER provides industry leading inspection capabilities for a variety of applications.
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