Used PANALYTICAL Epsilon 5 #9384266 for sale

PANALYTICAL Epsilon 5 is a state-of-the-art x-ray diffraction equipment designed for the research, industrial, and educational markets. It is widely used in materials science applications such as crystallography, and it is suitable for many applications such as phase identification or quantitative phase analysis of materials. The system is equipped with an advanced X-ray tube, PANALYTICAL PIXcel detector, and the DiffractOS software. The X-ray tube allows for an adjustable intensity range from 0.1 to 100 kW, making it suitable for a wide variety of X-ray diffraction measurements. The PIXcel detector is an advanced, high-resolution position sensitive detector capable of registering the angular position of an X-ray photon along its diffraction angle. The DiffractOS software is the control unit of the machine and allows the user to precisely control the tool parameters. Epsilon 5 allows for a wide range of X-ray measurements using its Sampling Asset, which is equipped with a slitted sample holder for samples up to 10 mm in diameter. In addition, it can be used for powder diffraction, rocking curve measurements, and profile measurements. The model is equipped with an interchangeable collimator equipment, that allows for small divergence and high flux for small samples. PANALYTICAL Epsilon 5 is capable of providing high quality data for both research and industrial applications, making it suitable for many applications including phase identification, qualitative composition studies, and X-ray Crystallography. The system has the capacity to characterize crystalline and amorphous materials, and it has the capability to characterize hydrogen bonding, oxidation states, and impurities. The unit is also equipped with high-end data collection and analysis capabilities, making it ideal for advanced measurement and analysis. It features a fast data acquisition, intuitive data analysis, and advanced 3D visualizations. In addition, the user can use the advanced analysis tools such as the Whole Pattern Refinement and the Lebail Refinement. Overall, Epsilon 5 is an advanced X-ray diffractometer with a wide range of applications. It is equipped with all the necessary components and capabilities for high quality X-ray measurements in both research and industrial settings. It is user-friendly and its advanced data acquisition and analysis capabilities make it suitable for various applications.