Used PANALYTICAL PW 1480 #293631546 for sale

PANALYTICAL PW 1480
Manufacturer
PANALYTICAL
Model
PW 1480
ID: 293631546
Wave dispersive X-Ray spectrometer Elemental analysis beads sequential 60 kV High intensity X-Ray tube, 3kW Rh-anode, 100 kV Generator, 3 kW Proportional flow counter Scintillation counter Fine collimator Universal collimator Collimator mask: Φ28 mm Tray for loader with 6-Positions Analytical system Crystal types: LiF 200 LiF 220 Pe 002 PX-1.
PANALYTICAL PW 1480 is an X-ray equipment designed to aid researchers in materials science. It is a versatile, high-performance system used to characterise the microstructural and morphological properties of materials. The unit is based on an X-ray diffraction method, incorporating a monochromatic CuKα X-ray source and a goniometer with two axes of motion. The machine includes a high-resolution CCD camera to capture diffraction data. The tool is capable of performing analysis of a wide range of materials, including metals, alloys, plastics, ceramics, semiconductors and other materials. It enables researchers to qualitatively and quantitatively determine the crystallographic phase compositions, as well as measure other microstructure properties such as grain size and texture. In addition, the analytical capabilities of the asset can be expanded by using a number of special-purpose crystals, such as a Lytle-type Bragg-Brentano (BB) geometry. This allows for the study of various effects, such as microstrain, strain gradients, point defects and impurities in a variety of materials. The model supports a broad set of sample preparation techniques and the ability to customise the selection of detectors and ports to meet the needs of the user. It features a solid-state detector that can be used to detect approximately one million elements, while the evaporative detector can be used to measure trace amounts of constituents. The equipment also includes a software suite that allows for the analysis and interpretation of the data gathered during the experiments. This includes a variety of analysis algorithms, as well as visualisation tools that allow researchers to view their results. Overall, PW 1480 is an advanced and highly versatile X-ray system that enables researchers to characterise samples down to the microstructural level. It is capable of analysing a variety of materials and measuring a wide range of properties. In addition, the proprietary software and special-purpose crystals allow users to extend their studies into areas such as microstrain, strain gradients, point defects and impurities.
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