Used PANALYTICAL XPert Pro #9108733 for sale

It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.

Manufacturer
PANALYTICAL
Model
XPert Pro
ID: 9108733
Vintage: 2009
X-Ray Diffractometer Goniometer : PW3050/65 MRD cradle : PW3060/20 Incident beam path (1) X'Pert tube : PW3373/10 Cu LFF DK184330 (2) X-ray mirror : Inc. Beam Cu W/Si (hybird MRD) (3) Monochromator : Inc. Beam 2xGe220 Cu Asym. (hybird) Diffracted beam path (1) Monochromator : Diffr. Beam Triple axis, 3xGe220 Cu Sym. (2) Detector : PW3011/20 (Miniprop. large window) 2009 vintage.
PANALYTICAL XPert Pro is a powerful X-ray diffractometer (XRD) equipment for high-resolution, full-range X-ray diffraction analysis. It is capable of providing high-resolution crystallography, phase identification, crystal structure refinement, and quantitative analysis of crystalline material. The system is composed of a filtered X-ray source, a sample chamber, X-ray detector, and associated computer control and data acquisition unit. PANALYTICAL X'PERT PRO machine is a turn-key tool, which requires very little user interaction and can be operated quickly and conveniently. It is designed to be compact and lightweight, so it is easy to move from one instrument to another and can be taken to on-site evaluation. The integrated PC-based control center of X-PERT PRO quickly establishes communication with the XRD detector and lets you have full control over the asset's parameters. XPert Pro is equipped with a high-resolution X-ray source that produces intense x-ray pulses that are filtered in order to enable extremely sensitive X-ray studies. The filtered X-ray pulses are then sent to the sample chamber, which holds the sample to be studied. The X-rays interact with the sample and diffract , producing a unique pattern known as a diffractogram, which is recorded by the XRD detector. X'PERT PRO can be used to analyze a wide range of crystalline compounds such as metals, ceramics, minerals, polymers, and semiconductors. It is equipped with an advanced data acquisition software developed by PANALYTICAL that offers various calculation and data quantification tools. This includes the quantification of crystallite size, lattice parameter selection, strain measurement, and phase identification. Thanks to the fast sample processing time of PANALYTICAL X-PERT PRO, results can be produced within a few minutes. PANALYTICAL XPert Pro is an essential tool for a variety of industries. It helps in the determination of crystallite size and lattice geometry, as well as the identification of mineral phases. It can also be used to detect internal defects such as cracks and crystal growth. PANALYTICAL X'PERT PRO is a reliable and robust XRD model that is designed to improve the quality and accuracy of results obtained from crystalline materials.
There are no reviews yet