Used PHILIPS / PANALYTICAL PW 2830 #293652326 for sale

PHILIPS / PANALYTICAL PW 2830 is a x-ray diffractometer equipment designed for structural analysis in the laboratory. It is a multi-purpose instrument, allowing for a wide variety of applications including qualitative, quantitative, and in-depth structural analysis. PHILIPS PW 2830 consists of a source, sample chamber, monochromator, detector, and associated electronics. The x-ray source consists of an x-ray tube which is driven by an electronic power supply. The high voltage supply for the x-ray tube can be set for up to 40 kV and is typically operated at 25 kV. The source is collimated to produce a beam with a divergence of 1-2.5 mrad, and the beam profile is adjustable to give the desired resolution. The sample is placed in a sample chamber, where it is exposed to the x-ray beam. The chamber is equipped with a motorized manipulator for positioning the sample. The sample can be oriented in almost any configuration, allowing for investigation of various types of crystal structures. The monochromator consists of an x-ray mirror and an energy filter. The x-ray mirror reflects the incident x-ray beam and directs it onto the sample. The energy filter is used to eliminate stray x-rays and to select the desired x-ray energy. The monochromator also provides an adjustable collimation of the beam, allowing for improved resolution of the diffraction patterns. The detection electronics of PANALYTICAL PW 2830 system consists of a detector, an amplifier, and a pulse shaping circuit. The detector is a semiconductor, typically a silicon based device with a permeable surface. The amplifier is used to increase the sensitivity of the detector. The pulse shaping circuit is used to condition the detector signal and ensure that only relevant signals are passed to the data acquisition unit. PW 2830 machine is capable of performing various types of diffraction, including in-plane, off-plane, and time-of-flight experiments. In addition, PHILIPS / PANALYTICAL PW 2830 can generate variety of graphs, including single crystal trace diagrams and Debye-Scherer diagrams. The tool is also equipped with software, allowing for data processing and analysis. Overall, PHILIPS PW 2830 is a powerful and reliable x-ray diffractometer asset that has been widely adopted for the study of crystal structure in the laboratory. It is capable of providing high quality results in a relatively short time span, and is equipped with a variety of features to assist in such investigations.