Used PHILIPS / PANALYTICAL PW 2830 #9211899 for sale

PHILIPS / PANALYTICAL PW 2830 is an X-ray diffractometer equipment designed for industrial applications. This system is able to analyze a wide range of sample types, including polymers, polycrystalline and single crystals, and even glass. Its high brilliance X-ray source and flexible detector options provide fast and accurate measurements. The unit is comprised of several components including an X-ray source, sample holder, movement machine, measurement tower, and detector. The X-ray source is a high brightness molybdenum anode X-ray tube, which can provide variable intensity X-ray radiation. The sample holder securely holds the sample in place while the movement tool allows for sample rotation and angular movement. The measurement tower houses the X-ray source, detector, and monochrometer, which filter and measure the X-ray radiation. PHILIPS PW 2830 is customizable in terms of its detectors and their placement. Options include an array of Peltier cooled silicon strip detectors or scintillation detectors, along with other necessary hardware, e.g. in-vacuum optics and adjustable collimation. It also provides a sample environment chamber and multi-sampleholder for further customization, including high temperature measurements in air or vacuum. The sample analysis on PANALYTICAL PW 2830 is straightforward and quick. Once the sample is placed in the sample holder and the detector is selected and mounted, one simply sets up the scan parameters and begins the measurement. Data is collected in real-time, and can be analyzed in various ways, such as plotting relative intensity, peak positions, peak intensity or background shapes, and more. The numbers generated from the analysis of a sample on PW 2830 can then be used to investigate the physical and chemical properties of the material being tested. Its combination of high quality data with user-friendly programming makes this X-ray diffractometer an ideal asset for a wide range of industrial applications.