Used PHILIPS / PANALYTICAL Semyos #9230721 for sale

PHILIPS / PANALYTICAL Semyos is an advanced X-ray equipment designed for the reliable analysis of materials in various applications. It is a powerful system that has both qualitative and quantitative capabilities, allowing for the excellent detection of any material composition. The unit uses an X-ray photon source which is generated by a high voltage source and an X-ray generator. The X-ray photons pass through the sample being analyzed while the detector obtains X-ray fluorescence spectra. The spectra is then processed to determine the elemental compositions, particle size and shape, as well as other physical characteristics of the sample. The combined shape and size analysis can be used to detect materials down to the nanometer range. This allows for unprecedented accuracy and detail in material analysis. The machine also has multiple analytical methods built into it, such as energy dispersive X-ray spectroscopy (EDS), wavelength dispersive X-ray spectroscopy (WDS), texture analysis, and fluorescence spectroscopy. These can be used to determine the elemental composition, particle size parameters, and surface texture. This is especially valuable for the analysis of materials in order to determine their suitability for applications such as electronics, pharmaceuticals, or SEM/TEM imaging. PHILIPS Semyos tool is also highly configurable and expandable. It can use various optics and detectors to provide an even greater level of precision and accuracy. This allows for high throughput and the possibility of adding more samples on the same platform. Additionally, the asset has extensive data logging and reporting capabilities. In summary, PANALYTICAL Semyos model is a highly advanced X-ray equipment for materials analysis. Its excellent accuracy, configurability, and expandability make it an ideal system for any number of applications. With its range of analytical methods and its ability to detect materials down to the nanometer range, it provides unparalleled information on the composition, particle size, and shape of materials.