Used PHILIPS / PANALYTICAL Xpert MRD #193184 for sale

PHILIPS / PANALYTICAL Xpert MRD (X-Ray Diffraction Equipment) is a research-grade system and an efficient choice for both high-resolution structural characterization and routine qualitative analysis of materials. PHILIPS Xpert MRD unit collects angle-dispersed x-ray diffraction (XRD) data on the whole sample at once, making it faster and more efficient than other XRD systems. This machine is divided into two main components, the x-ray generator (which includes an x-ray tube, shutter, collimator, x-ray shielding, and a row of power supplies) and a detector. The x-ray generator of PANALYTICAL Xpert MRD supplies the radiation emitted from the x-ray tube. It is made up of a high voltage power supply, a shuttered x-ray tube, and a collimator tool. The x-ray tube is mounted on an angular goniometer which rotates the tube and its anode in a circular motion. This angular component of the asset controls the x-ray dose for the sample being analyzed. The shuttered x-ray tube with its anode alloy material (usually molybdenum or tungsten) is designed to produce an optimal x-ray beam for the material being tested. The x-ray detector of Xpert MRD is a state-of-the-art device capable of precisely measuring x-ray diffraction data in all directions. The detector is attached to a specialized scintillation screen, a light-sensitive material that converts the x-ray radiation into visible light. This provides for an easy-to-use interface for the angle-dispersed data collection. The detector contains a proportional counter consisting of a gas-filled cylinder filled with an inert gas and topped with a light-sensitive material. In response to an x-ray impact, the gas in the cylinder glows for a short period and the light is detected and recorded. PHILIPS / PANALYTICAL Xpert MRD is a powerful and reliable model for materials characterization. With its XRD data, a variety of physical properties of materials can be studied such as strain, chemical composition, deformed lattice structure, lattice planes orientation, crystal structure misalignment, grain sizes, mechanical properties, residual stress and so on. In short, this is an excellent choice for both high-resolution research and routine qualitative materials analysis.