Used PHILIPS / PANALYTICAL Xpert #293624122 for sale

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Manufacturer
PHILIPS / PANALYTICAL
Model
Xpert
ID: 293624122
X-Ray Diffractometer (XRD).
PHILIPS / PANALYTICAL XPert is a state-of-the-art x-ray equipment designed for various analytical applications. This multi-purpose system features an ultrasensitive x-ray detector, multiple sample stages, and user-friendly software interface to provide an efficient and reliable analytical solution. PHILIPS XPert is equipped with an advanced X-ray tube that is capable of providing high-resolution images and excellent signal-to-noise ratio. This combination ensures that the xpXpert unit can capture detailed information and structure of the specimen while producing reliable and accurate results. The xpXpert is also equipped with an advanced, multi-axis machine that allows the user to control the orientation of the specimen in terms of both azimuth and elevation. This feature allows the user to rotate the specimen and produce high-resolution, three-dimensional images and profiles. In addition to the various imaging systems, PANALYTICAL XPert features a range of sample stages for various sample characterization, including: electron backscatter diffraction, grazing-incidence x-ray diffraction, laser confocal scanning x-ray diffraction, and more. These stages are designed to provide an in-depth analysis of various physical properties related to the specimen. The xpXpert tool is also equipped with intuitive software that allows the user to control the instrument and adjust the settings according to the desired analysis. The software is packed with multiple options, from sample registration and imaging parameters, to data collection and analysis visuals. Moreover, its easy-to-use graphical user interface makes it a suitable choice for both experienced and novice users. In short, XPert is a powerful and reliable x-ray asset with a wide range of analytical applications. It is equipped with multiple sample stages, intuitive software interface, and advanced imaging technologies, making it an ideal choice for efficient and reliable characterization of various materials.
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