Used RIGAKU 3620 #179060 for sale

Manufacturer
RIGAKU
Model
3620
ID: 179060
X-Ray Analyzer.
RIGAKU 3620 x-ray equipment is a state-of-the-art system that enables the measurement of x-ray diffraction (XRD) characteristics for materials. It is designed for rapid, accurate analysis of crystalline material qualities through a small footprint. The use of 3620 XRD unit allows for both qualitative and quantitative evaluation of materials. The machine's primary feature is its optimized X-ray path capable of 4X vertical and 6X horizontal magnification. The CCD (charge-coupled device) camera used in the tool has excellent sensitivity, dynamic range, and spectral resolution. These features in combination with the X-Ray optics enable the asset to achieve a high resolution, which results in excellent data acquisition and analysis. RIGAKU 3620 XRD model also features advanced Software for data analysis which is designed for peak detection, indexing and quantifying diffraction data. With the equipment's software, data can be filtered and manipulated for optimum results. It also has the capability for automated 2D & 3D reconstruction, in addition to advanced library-based information retrieval. The system also features three different source types such as Cu-Kα, Mo-Kα and Co-Kα which provides compatible data and reliable results whatever the analytical problems, such as phase identification and quantitative analysis. 3620 comprises a wide variety of optical components coupled with superior mechanical design, which helps to reduce the time and effort needed for sample analysis. The electrical design includes multiple lines—assist in harmonizing the electrons and to reduce background noise. Moreover, it provides excellent sensitivity and easy measurement of a broad range of crystalline materials. RIGAKU 3620 XRD unit is a highly versatile machine, suitable for a range of applications that include minerals, ceramics, pharmaceuticals, polymers and nanomaterials. In sum, 3620 XRD tool provides an efficient and reliable solution for measuring X-ray diffraction characteristics of various materials. Through its state-of-the-art features, optimized X-ray path and advanced software capabilities, it enables superior accuracy and faster data capture for research and development laboratories.
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