Used RIGAKU 3630 #9087733 for sale

RIGAKU 3630
Manufacturer
RIGAKU
Model
3630
ID: 9087733
X-ray fluorescence spectrometer.
RIGAKU 3630 is a versatile X-ray system used for crystallography, materials analysis, thin film analysis, and small-angle X-ray scattering (SAXS) research. It is equipped with several components that allow it to be used for a variety of experiments including those requiring high-resolution X-ray imaging. 3630 is comprised of both an X-ray source and an X-ray detector, with a monochromator located in between. The X-ray source is a variable power sealed tube (30-100 kW) that is filled with an inert gas and is capable of producing monochromatic X-rays (wavelengths between 0.09 and 4.0 nm). The monochromator is a two-bounce T-bend Ge(111) crystal that is capable of diffracting X-rays from a variety of sample sizes and materials. The X-ray detector is a two-dimensional array detector with high-speed data acquisition capabilities and can be configured according to the experiment requirements. RIGAKU 3630 is also equipped with robust control and data acquisition systems that allow for the easy integration with other laboratory equipment such as microscopes and spectrometers. Additionally, there are a variety of optional sample preparation accessories including sample holders, a sample rotation stage, and an "air cell" which allows for sample analysis without atmosphere disturbances. 3630 can be used for multiple analyses such as diffraction, imaging, and mapping. In diffraction mode, the instrument is capable of detecting small changes in the lattice periodicity of crystalline materials, as well as the collection of data from textured, twinned, and distorted samples. In imaging mode, RIGAKU 3630 is capable of producing high-resolution 3D maps of crystalline and non-crystalline materials. As for mapping, the instrument is capable of performing wide-range mapping analysis which gives users the ability to view a sample's X-ray scattering pattern across large areas and at various angles. 3630 is an invaluable tool for scientists looking to study the X-ray diffraction characteristics of various materials. With its incredible flexibility, paired with its user-friendly, intuitive software, researchers of all levels are able to explore the nuances of their samples and uncover their properties.
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