Used RIGAKU 3630 #9099593 for sale
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RIGAKU 3630 is an X-ray diffractometer that utilizes a CuKα source. The X-ray generator, coupled with an imaging plate, allows scans that produce high-resolution images for a variety of analyses. The X-ray beam is directed at asample and diffracted beams are detected. These diffracted beams, through a combination of Si-pin diodes and X-ray optics, then interact with a scintillation counter located behind a scattering slit equipment to produce a differential signal. This signal is read by two independent data channels, amplifying the signal before converting it to digital format. The X-ray diffractometer also has an internal variable step function that allows for regions of increased stiffness along the scan path. This prevents the sample from being over-stressed during the analysis. An adjustable vertical collimator allows for data points to be acquired at the desired angles in the X-ray unit. The vertical collimator is adjustable to the angle of incidence, allowing for a very precise readout that is suitable for accurate data analysis. The X-ray generated by 3630 is then passed througha detector system that includes both a top-loading image plate and a scattering slit unit. The image plate allows for the full spectrum of X-ray diffraction to be acquired, while the scattering slit machine reduces the extraneous noise to improve the resolution of the data points collected. The data collected from RIGAKU 3630 is then interpreted into a graphical display. The graphical output can be configured to display the XRD data in several formats, providing the user with a detailed view of the structural phases present in the sample. The graphicaloutput can also be edited further, allowing for a better visual representation of the data. 3630 is a versatile X-ray diffractometer, capable of providing detailed information about the molecular and crystal structures of a variety of samples. Its adjustable vertical collimator, along with its high-resolution imaging plate, provide the user with a reliable, accurate tool for data analysis. With this tool, the user can easily measure the structural characteristics of crystalline and amorphous samples, allowing them to gain valuable insight into their properties.
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