Used RIGAKU 3640 #9396767 for sale

RIGAKU 3640
Manufacturer
RIGAKU
Model
3640
ID: 9396767
Wafer / Disk analyzer.
RIGAKU 3640 X-ray diffractometer is a powerful X-ray analysis tool. Utilizing wavelength-dispersive X-ray microanalysis (XMA), 3640 offers superior speed and resolution with a high degree of accuracy. This equipment is ideal for advanced materials, chemical and structural analysis, and thin-film characterization. Simple and straightforward, RIGAKU 3640 uses a single wavelength-dispersive 140 kvolts X-ray tube that produces powerful X-ray beams with a spot size of 0.5 mm. This high-powered beam penetrates opaque materials, allowing the analysis of inner layers or coatings. At the heart of 3640 is a computer-controlled acquisition system. This unit allows a user to collect high-resolution x-ray data at rapid speeds for fast analysis. A malachite based detector is used to capture the diffracted X-rays. The malachite detector is designed to be used in combination with the x-ray unit and the machine's vacuum diffraction chamber. The combination of these components is highly efficient, enabling accurate and rapid data collection. RIGAKU 3640 also features a slant-type stage for convenient sample manipulation. This allows users to quickly and accurately rotate the sample as needed. Additionally, 3640 is equipped with an automated sample-loading tool, enabling users to easily place and remove samples. Additional features of RIGAKU 3640 include a complete set of software packages, including an intuitive user-friendly graphical user interface (GUI). This software is designed to assist users in setting up experiments and acquiring data. 3640 also offers powerful CAD/CAE integration capabilities, which enable the analysis of objects in 3-D. Overall, RIGAKU 3640 is an efficient and versatile X-ray diffractometer. This advanced technology provides users with reliable and accurate data for a variety of applications. With effortless sample manipulation and a wide range of features, this asset is ideal for researchers in material science, thin-film characterization, chemical and structural analysis.
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